Physical Measurement Laboratory (PML)
Title: Developing CMOS+X Platforms for Artificial Intelligence and Beyond
Crossing the gap from “lab-to-fab” requires more than just demonstrating a new concept or device – it requires building prototype systems at intermediate scales which can achieve both a far higher volume of statistics as well as greater degree of measurement precision. Unfortunately, developing such prototypes is largely out of the reach of most academic researchers due to the high non-recurring engineering costs for the test vehicles to demonstrate these prototypes. In this lecture, the challenges of integrating new and emerging technologies in semiconductor foundries will be reviewed across technical, legal, and financial barriers. Test vehicles developed by NIST researchers, and the results of utilizing those test vehicles, such as the integration of MRAM and RRAM devices on CMOS, will show how it is practical to address these issues through resilient circuit design and fabrication flows designed for advanced prototyping. From there, we will provide a preview of our next generation of manufacturing test vehicles developed in collaboration with researchers around the country to tackle challenges in AI, spintronics, and bioelectronics research which we hope will provide new and accessible pathways to advanced prototyping of CMOS+X technologies.
Brian Hoskins is a research physicist in the Alternative Computing Group in the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML). He received both a B.S. and an M.S. in Materials Science and Engineering from Carnegie Mellon University and a Ph.D. in Materials from the University of California, Santa Barbara. For his doctoral research, he developed and characterized resistive switching devices for use in neuromorphic networks. Brian is working on CMOS integration of resistive switches for the development and characterization of intermediate scale neuromorphic networks.
Host: Dr. Mircea Stan
Organizer: Dr. Mona Zebarjadi