FEI Titan Transmission Electron Microscope (TEM)

Atomic-Scale Imaging and Nanoscale Compositional Analysis for Materials

Titan Grouping -L.jpg

Location: Jesser Hall room 158

The FEI Titan system allows for imaging of materials with atomic resolution in both the Transmission Electron Microscopy (TEM) and the Scanning TEM (STEM) modes. Compositional analysis is available using Energy Dispersive X-Ray Spectroscopy (EDX).

TEM Technique Summary:

Atomic resolution imaging of crystal lattices in TEM and STEM modes
Imaging of defects, precipitates and interfaces using bright- and dark-field techniques
Elemental Composition for Z>5
Elemental Sensitivity: < 1 wt.% with spatial resolution in the 10 nm range
Electron diffraction for structural analysis of areas with diameters > 150 nm
Cryo- and heating options for samples
Samples can be powders or materials thinned to less than 1 micron in thickness
Maximum sample diameter: 3 mm, maximum height: 0.25 mm

STEM/TEM Features:

80-300 kV S-Twin platform
STEM and TEM system with Field Emission Gun
Resolution: STEM: 0.20 nm; TEM: 0.19 nm
Oxford EDX X-ray detector for energy dispersive X-ray analysis
Low-background Double-Tilt Specimen Holder, alpha tilt angles up to 40°
Cold Stage (liquid nitrogen) and Heating Stage (up to 850°C) Double-Tilt Specimen Holders
Titan Smart Tilt
Gatan Oneview camera: 4096x4096 pixels with 25.1 fps
HAADF, Bright Field, and Dark Field STEM detectors
Titan Compucentricity
Titan Free Lens Control Operating range: 0.5 to 30 kV in 0.1 kV steps

UVA RATES:

Titan 80-300 STEM Instrument Usage: $72/hr

Titan 80-300 STEM Operator Costs: $60/hr

TEM Specialty Holder Use: $10/day

EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTIONS RATES:

Titan 80-300 STEM Instrument Usage (Operator Costs Included): $150/hr

TEM Specialty Holder Use: $20/day

INDUSTRIAL PARTNER RATES:

Titan 80-300 STEM Instrument Usage (Operator Costs Included): $325/hr

TEM Specialty Holder Use: $60/day

.*Rates are for reference only. See R. White for current instrument costs.