FEI Titan Transmission Electron Microscope (TEM)

Atomic-Scale Imaging and Nanoscale Compositional Analysis for Materials

Titan Grouping -L.jpg


Location: Jesser Hall room 158

The FEI Titan system allows for imaging of materials with atomic resolution in both the Transmission Electron Microscopy (TEM) and the Scanning TEM (STEM) modes. Compositional analysis is available using Energy Dispersive X-Ray Spectroscopy (EDX).


TEM Technique Summary:

  • Atomic resolution imaging of crystal lattices in TEM and STEM modes
  • Imaging of defects, precipitates and interfaces using bright- and dark-field techniques
  • Elemental Composition for Z>5
  • Elemental Sensitivity: < 1 wt.% with spatial resolution in the 10 nm range
  • Electron diffraction for structural analysis of areas with diameters > 150 nm
  • Cryo- and heating options for samples
  • Samples can be powders or materials thinned to less than 1 micron in thickness
  • Maximum sample diameter: 3 mm, maximum height: 0.25 mm

STEM/TEM Features:

  • 80-300 kV S-Twin platform
  • STEM and TEM system with Field Emission Gun
  • Resolution: STEM: 0.20 nm; TEM: 0.19 nm
  • Oxford EDX X-ray detector for energy dispersive X-ray analysis
  • Low-background Double-Tilt Specimen Holder, alpha tilt angles up to 40°
  • Cold Stage (liquid nitrogen) and Heating Stage (up to 850°C) Double-Tilt Specimen Holders
  • Titan Smart Tilt
  • Gatan Oneview camera: 4096x4096 pixels with 25.1 fps
  • HAADF, Bright Field, and Dark Field STEM detectors
  • Titan Compucentricity
  • Titan Free Lens Control Operating range: 0.5 to 30 kV in 0.1 kV steps




Titan 80-300 STEM Instrument Usage: $72/hr

Titan 80-300 STEM Operator Costs:  $60/hr

TEM Specialty Holder Use: $10/day




Titan 80-300 STEM Instrument Usage (Operator Costs Included):  $150/hr

TEM Specialty Holder Use: $20/day




Titan 80-300 STEM Instrument Usage (Operator Costs Included): $325/hr

TEM Specialty Holder Use: $60/day


.*Rates are for reference only. See R. White for current instrument costs.