Themis 60-300 kV Transmission Electron Microscope (TEM)

Atomic-Scale Imaging and Nanoscale Compositional Analysis for Materials

Location: Wilsdorf Hall B011 and B013

The Themis system from Thermo Fisher Scientific allows for imaging of materials with atomic resolution in both the Transmission Electron Microscopy (TEM) and the probe-corrected Scanning TEM (STEM) modes. Compositional analyses and mapping are available using Energy Dispersive X-Ray Spectroscopy (EDS) and Electron Energy-Loss Spectroscopy (EELS).

TEM Technique Summary:

• Atomic resolution imaging of crystal lattices in TEM and STEM modes
• Imaging of defects, precipitates and interfaces using bright- and dark-field techniques
• Elemental Composition for Z>2
• Elemental Sensitivity: < 1 wt.% with spatial resolution in the nm range
• Electron diffraction for structural analysis of areas with diameters > 150 nm
• In-situ of imaging of samples during cooling and heating experiments
• In-situ imaging of liquids and during electrochemical experiments
• Samples can be powders or materials thinned to less than 1 micron in thickness
• Maximum sample diameter: 3 mm, maximum height: 0.25 mm

TEM Features:

• 80-300 kV S-Twin platform
• STEM and TEM system with Field Emission Gun and Gatan 966 Energy-Loss Spectrometer
• Monochromator: Energy resolution<200 mV at 300 kV, energy resolution<30 mV at 60 kV
• Resolution: probe-corrected STEM: 0.07 nm; TEM: 0.19 nm
• Super X EDS system (4 silicon drift detectors)
• Low-background Double-Tilt Specimen Holder, alpha tilt angles up to 40°
• Cold Stage (liquid nitrogen) and Heating Stage (up to 850°C) Double-Tilt Specimen Holders
• Rotation holder and q-slit for momentum resolved EELS
• Poseidon liquid cell holder for in-situ electrochemical experiments
• Ceta camera: 4096x4096 pixels
• HAADF, BF, DF, and Differential Phase Contrast detectors for STEM