FEI Titan Transmission Electron Microscope (TEM)

Atomic-Scale Imaging and Nanoscale Compositional Analysis for Materials

Titan Grouping -L.jpg


Location: Jesser Hall room 158

The FEI Titan system allows for imaging of materials with atomic resolution in both the Transmission Electron Microscopy (TEM) and the Scanning TEM (STEM) modes. Compositional analysis is available using Energy Dispersive X-Ray Spectroscopy (EDS).


** Only STEM mode imaging currently available on Titan **


TEM Technique Summary:

  • Atomic resolution imaging of crystal lattices in TEM and STEM modes
  • Imaging of defects, precipitates and interfaces using bright- and dark-field techniques
  • Elemental Composition for Z>5
  • Elemental Sensitivity: < 1 wt.% with spatial resolution in the 10 nm range
  • Electron diffraction for structural analysis of areas with diameters > 150 nm
  • Cryo- and heating options for samples
  • Samples can be powders or materials thinned to less than 1 micron in thickness
  • Maximum sample diameter: 3 mm, maximum height: 0.25 mm

TEM Features:

  • 80-300 kV S-Twin platform
  • STEM and TEM system with Field Emission Gun
  • Resolution: STEM: 0.16 nm; TEM: 0.19 nm
  • EDAX retractable X-ray detector (0.13 Sr collection angle)
  • Low-background Double-Tilt Specimen Holder, alpha tilt angles up to 40°
  • Cold Stage (liquid nitrogen) and Heating Stage (up to 850°C) Double-Tilt Specimen Holders
  • Titan Smart Tilt
  • Gatan Oneview camera: 4096x4096 pixels with 25.1 fps
  • HAADF STEM detector
  • Titan Compucentricity
  • Titan Free Lens Control Operating range: 0.5 to 30 kV in 0.1 kV steps
  • Low-Dose Exposure Technique




Titan 80-300 STEM Instrument Usage: $72/hr

Titan 80-300 STEM Operator Costs:  $55/hr




Titan 80-300 STEM Instrument Usage (Operator Costs Included): $143/hr




Titan 80-300 STEM Instrument Usage (Operator Costs Included): $325/hr


.*Rates are for reference only. See R. White for current instrument costs.