Raman Spectrometer-Atomic Force Microscope (Raman-AFM)

Molecular Identification and Chemistry of Surfaces, combined with Nano-Scale Surface Morphology


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AFM - Joe Thompson.jpg

 

Location: MSE 142

Renishaw InVia™ Confocal Raman microscope and integrated Bruker Innova AFM provides nondestructive chemical composition and phase in conjunction with topographic, nano-mechanical and electronic properties. Raman mapping with 1 micron spatial resolution. Tip-Enhanced Raman spectroscopy (TERS) for enhanced surface specificity. Photoluminescence spectroscopy. Wavelength Range: 100 1/cm to 4000 1/cm. Hot/Cold and Heating stages available for temperature-programmed spectroscopy.

 

Raman Spectroscopy Technique Summary:

 
  • Non-destructive Molecular Compositional Analysis of Pharmaceuticals, Biostructures, Semiconductors, Photovoltaics, Polymers, Geology, Mineralogy, Pigments, Contaminant Identification, etc.
  • Molecular Composition of Solids, Liquids, and Loose or Pressed Powders
  • Identification of Molecular Impurities with High Sensitivity
  • Raman does not provide information on Metals and Alloys
  • Molecular Information Depth ~ 1micron, ~10 nm with TERS
  • Spatial Resolution , < 2 micron, ~ 20 - 30 nm with TERS
  • Collect sequential Raman and AFM measurements
  • Hot Stage to 1773K (1500 C)
  • Hot/Cold Stage: ~120K - 873K ( -196 - 600 C)
  • Sample size from <10 micron dia. to 5’ x 3’ x 8” (size of optical table)

 

Atomic Force Microcopy Technique Summary:

 
  • Non-destructive analysis of Sample Surface Topography
  • Contact mode, Tapping Mode and STM Available
  • Samples maybe in air or in liquid
  • Single Point Spectroscopy for a detailed characterization of local electrical or mechanical properties
  • Magnetic Force Microscopy (MFM) measures magnetic force gradient distribution above the sample surface
  • Electric Force Microscopy (EFM) measures electric force gradient distribution above the sample surface
  • Nanolithography with probe tip to scribe or indent a sample surface by mechanical pressure
  • AFM Mapping space: 250 x 250 x 100 microns3
  • Sample size to 45mm x 45mm x18mm

 

Raman Features:

 
  • Stereo viewing (binocular eyepieces)
  • Point mapping, StreamHR, depth profile, volume mapping
  • Automated measurement queuing
  • Automated Raman calibration correction (quick calibration)
  • Laser auto-align
  • Raman signal auto-align
  • Four available laser probes: 405, 488, 514 and 785 nm
  • Lenses: 5x, 20x, 50x and 50x with large numerical aperture.

 

AFM Features:

 
  • Large Area scan: XY >90 µm, Z >7.5 µm (Closed-Loop)
  • Small Area scan: XY >5 µm, Z >1.5 µm (Open-Loop)
  • Open-Loop Drift: <1 nm/min
  • Closed-Loop Drift: <3 nm/min (warm-up time 15 min)
  • Images of height (scan size 1 to 10 microns) and feedback enabled, scan rates are 1-4 Hz
  • Images size: 16 x 16, 32x32, 64x64, 128x128, 256x256, 512x512 or 1024x1024
  • Motorized Z-travel: 18mm
  • On-axis, 1.25 mm - 0.25 mm FOV
  • Software-controlled 5x motorized zoom
  • 10x objective (50x optional)
  • <2 µm resolution (0.75 µm resolution with 50x)

UVA RATES:

 

Renishaw Raman / AFM Instrument Usage: $25/hr (Raman) & $10/hr (AFM)

Renishaw Raman / AFM Operator Costs:  $55/hr

Hot/Cold Stage Use: $10/session

 

EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:

 

Renishaw Raman / AFM Instrument Usage (Operator Costs Included): $100/hr (Raman) & $80/hr (AFM)

Hot/Cold Stage Use: $10/session

 

INDUSTRIAL PARTNER RATES:

 

Renishaw Raman / AFM Instrument Usage (Operator Costs Included): $250/hr (Raman) & $160/hr (AFM)

Hot/Cold Stage Use: $20/session

 

.*Rates are for reference only. See R. White for current instrument costs.