Raman Spectrometer-Atomic Force Microscope (Raman-AFM)

Molecular Identification and Chemistry of Surfaces, combined with Nano-Scale Surface Morphology

AFM - Joe Thompson.jpg


Location: Jesser Hall room 142

Renishaw InVia™ Confocal Raman microscope and integrated Bruker Innova AFM provides nondestructive chemical composition and phase in conjunction with topographic, nano-mechanical and electronic properties. Raman mapping with 1 micron spatial resolution. Tip-Enhanced Raman spectroscopy (TERS) for enhanced surface specificity. Photoluminescence spectroscopy. Hot/Cold and Heating stages available for temperature-programmed spectroscopy.


Raman Spectroscopy Technique and Specifications Summary:

  • Non-destructive Molecular Compositional Analysis of Pharmaceuticals, Biostructures, Semiconductors, Photovoltaics, Polymers, Geology, Mineralogy, Pigments, Contaminant Identification, etc.
  • Molecular Composition of Solids, Liquids, and Loose or Pressed Powders
  • Identification of Molecular Impurities with High Sensitivity
  • Raman does not provide information on Metals and Alloys
  • Molecular Information Depth: ~ 1micron, ~10 nm with TERS
  • Spatial Resolution: < 2 micron, ~ 20 - 30 nm with TERS
  • Spectral Range: 405 nm - NIR (limit is 1022 nm or 1.213 eV)
  • Laser Line Cut-Off: Approx 100 cm-1 from the laser line (except for 405 nm laser which has a usable cutoff approx. 200 cm-1 from the laser line)
  • Collect sequential Raman and AFM measurements
  • Hot Stage Temps: Room Temp to 1773K (1500 C)
  • Hot/Cold Stage Temps: ~120K - 873K ( -196 - 600 C)
  • Sample size: from <10 micron dia. to 5’ x 3’ x 8” (size of optical table)


Atomic Force Microcopy Technique and Specifications Summary:

  • Non-destructive analysis of Sample Surface Topography
  • Modes: Contact mode, Tapping Mode and STM Available
  • Samples maybe in air or in liquid
  • Single Point Spectroscopy for a detailed characterization of local electrical or mechanical properties
  • Magnetic Force Microscopy (MFM) measures magnetic force gradient distribution above the sample surface
  • Electric Force Microscopy (EFM) measures electric force gradient distribution above the sample surface
  • Nanolithography with probe tip to scribe or indent a sample surface by mechanical pressure
  • AFM Mapping space: 250 x 250 x 100 microns3
  • Sample size: to 45mm x 45mm x18mm


Raman Features:

  • Full system automation (laser, grating, and filter selection)
  • 4 Wavelengths available from 3 Lasers:

    • Diode Laser: 785 nm
    • Argon Laser: 514 nm
    • Argon Laser: 488 nm
    • Diode Laser: 405 nm
  • Microscope with 4 objectives: 5x, 20x, and 50x, plus 50x with large numerical aperture
  • Three gratings: 1200gr/mm, 1800gr/mm, and 3000gr/mm
  • Stereo viewing (binocular eyepieces)
  • Point mapping, StreamHR, depth profile, volume mapping
  • Automated measurement queuing
  • Automated Raman calibration correction (quick calibration)
  • Laser auto-align
  • Raman signal auto-align


AFM Features:

  • Large Area scan: XY >90 µm, Z >7.5 µm (Closed-Loop)
  • Small Area scan: XY >5 µm, Z >1.5 µm (Open-Loop)
  • Open-Loop Drift: <1 nm/min
  • Closed-Loop Drift: <3 nm/min (warm-up time 15 min)
  • Images of height (scan size 1 to 10 microns) and feedback enabled, scan rates are 1-4 Hz
  • Images size: 16 x 16, 32x32, 64x64, 128x128, 256x256, 512x512 or 1024x1024
  • Motorized Z-travel: 18mm
  • On-axis, 1.25 mm - 0.25 mm FOV
  • Software-controlled 5x motorized zoom
  • 10x objective (50x optional)
  • <2 µm resolution (0.75 µm resolution with 50x)



Renishaw Raman / AFM Instrument Usage: $28/hr (Raman) & $ 25/hr (AFM)

Renishaw Raman / AFM Operator Costs:  $60/hr

Hot/Cold Stage Use: $10/session




Renishaw Raman / AFM Instrument Usage (Operator Costs Included):  $110/hr (Raman) & $100/hr  (AFM)

Hot/Cold Stage Use: $10/session




Renishaw Raman / AFM Instrument Usage (Operator Costs Included): $250/hr (Raman) & $160/hr (AFM) --> after (7/1/23)  $200/hr (Raman) & $160/hr (AFM)

Hot/Cold Stage Use: $20/session


.*Rates are for reference only. See R. White for current instrument costs.