Gatan 691 Precision Ion Polishing System
Argon ion thinning of samples for Transmission Electron Microscopy (TEM)
Location: Jesser Hall room 131
The Gatan 691 PIPS system is used as the final preparation step for many types of TEM samples. 3 mm disks cut from bult materials or from embedded cross sections are thinned to less than 50 micron before argon ion milling in the FIB.
PIPS Technique Summary:
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Up to 6 kV argon ion energy
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Rotating sample to provide uniform milling
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Two ion guns for milling from top and from bottom
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Adjustable beam tilt angles from 2 to 10 degrees incident angle
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Ion milling at specific segments during sample rotation for directional ion milling and to protect the sample holder
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Suited for conductive and non-conductive samples
PIPS Features:
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Cryo attachment with liquid nitrogen for sample cooling
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Auto termination option when electron tranparency is reached
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Optical microscope with digital camera to monitor ion milling progress
Operating manuals and additional information may be found in the Sample Preparation folder on UVa's Sharepoint.