X-Ray Characterization Instrumentation
NMCF maintains several types of X-ray characterization for bulk and surface characterization of materials. X-ray diffraction (XRD) provides information on bulk composition and phase for any polycrystalline material including geologic, metal alloy, inorganic, organometallic and organic substances. Quantitative elemental and oxide composition of bulk materials - solids, powders, and liquids - can be measured with high sensitivity using X-ray fluorescence (XRF). X-ray photoelectron spectroscopy (XPS) provides quantitative chemical and elemental composition of material surfaces as a function of position. X-ray reflectivity (XRR) can be done on all XRD instrumentation. Single-crystal X-ray diffraction for novel materials provides details about molecular spacing and crystal structure; single-crystal XRD is available through UVa's Chemistry Dept.