X-ray Fluorescence Spectrometer (XRF)

Bulk Elemental Compositional Analysis for Solids, Powders, and Liquids

Benchtop Panalytical Epsilon 3x Energy-Dispersive XRF spectrometer

XRF Image 2.PNG

Location: Jesser Hall room 108

XRF spectrometer with a silver (Ag) anode x‐ray tube and 50 micron Be window performs non‐destructive identification and quantification (< 1 ppm) of elements from sodium (Na) to americium (Am) in solids, liquids, loose‐ and pressed‐powders. Silicon drift detector for secondary X-ray detection. Omnian standardless analysis software for peak ID and quantification.


XRF Technique Summary:

  • Non-destructive Analysis of Metals, Glasses, Ceramics, Plastics, Geologic Materials, Organics, Art, Ground Water, Catalysts, Pharmacuticals, etc.
  • Elemental Composition of Solids, Liquids, and Loose or Pressed Powders for 11 ≤ Z ≤ 95
  • Identification of Elemental Impurities with Sensitivity < 1 ppm
  • Quantitative Elemental Analysis of Materials using Material Standards or Omnian Standardless Analysis Software Package
  • Spectral Energy Resolution ≤ 145 eV
  • Elemental Sensitivity:< 1 ppm (by weight)
  • Batch analysis with ten-position sample tray
  • Sample size from ~ 100 mg to ~ 1000 g or up to 18 ml or 10 x 20 x 10 cm3 ( H x W x D)

XRF Features:

  • Source: X‐ray tube with Ag anode and 50 micrometer Be window
  • Software selectable beam filters (Cu 500 μm, Al 50 μm, Al 200 μm, Ti 7 μm, Ag 100 μm, Cu 300 μm)
  • Silicon drift detector (SDD) for X-ray detection with a resolution ≤ 145 eV
  • 50 keV X-ray detection max; 9 W max.
  • 10‐position sample tray with 10 standard sample holders and a set of inserts
  • Sample spinner
  • Helium (He) purge system
  • 2-D Optical Geometry with fixed angles
  • Standard sample cup: 18 ml (OD: 35 mm; ID: 28 mm; H: 30 mm)
  • Small mass holders: 0.5 ml; (ID: 18mm; H: 2 mm)
  • Mylar or Prolene thin films for sample cups
  • High lid for analysis of large samples with maximum dimensions of 10 x 20 x 10 cm3 (H x W x D)
  • Omnian Analysis Software for Element or Oxide Quantification without Calibration Standards
  • Fluorescent Volume Geometry (FVG) and unmeasured 'Dark Matrix' compound corrections with Omnian


More information on using OMNIAN Software for standardless quantification can be found on the Malvern-Panalytical Website.



XRF Instrument Usage: $28/hr

XRF Operator Costs:  $60/hr




XRF Instrument Usage: $55/hr

XRF Operator Costs:  $70/hr

XRF Sample Cup: $2/sample




XRF Instrument Usage: $125/hr

XRF Operator Costs:  $125/hr

XRF Sample Cup: $2/sample


.*Rates are for reference only. See R. White for current instrument costs.