X-ray Fluorescence Spectrometer (XRF)
Bulk Elemental Compositional Analysis for Solids, Powders, and Liquids
Benchtop Panalytical Epsilon 3x Energy-Dispersive XRF spectrometer
Location: Jesser Hall room 108
XRF spectrometer with a silver (Ag) anode x‐ray tube and 50 micron Be window performs non‐destructive identification and quantification (< 1 ppm) of elements from sodium (Na) to americium (Am) in solids, liquids, loose‐ and pressed‐powders. Silicon drift detector for secondary X-ray detection. Omnian standardless analysis software for peak ID and quantification.
XRF Technique Summary:
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Non-destructive Analysis of Metals, Glasses, Ceramics, Plastics, Geologic Materials, Organics, Art, Ground Water, Catalysts, Pharmacuticals, etc.
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Elemental Composition of Solids, Liquids, and Loose or Pressed Powders for 11 ≤ Z ≤ 95
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Identification of Elemental Impurities with Sensitivity < 1 ppm
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Quantitative Elemental Analysis of Materials using Material Standards or Omnian Standardless Analysis Software Package
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Spectral Energy Resolution ≤ 145 eV
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Elemental Sensitivity:< 1 ppm (by weight)
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Batch analysis with ten-position sample tray
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Sample size from ~ 100 mg to ~ 1000 g or up to 18 ml or 10 x 20 x 10 cm3 ( H x W x D)
XRF Features:
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Source: X‐ray tube with Ag anode and 50 micrometer Be window
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Software selectable beam filters (Cu 500 μm, Al 50 μm, Al 200 μm, Ti 7 μm, Ag 100 μm, Cu 300 μm)
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Silicon drift detector (SDD) for X-ray detection with a resolution ≤ 145 eV
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50 keV X-ray detection max; 9 W max.
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10‐position sample tray with 10 standard sample holders and a set of inserts
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Sample spinner
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Helium (He) purge system
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2-D Optical Geometry with fixed angles
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Standard sample cup: 18 ml (OD: 35 mm; ID: 28 mm; H: 30 mm)
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Small mass holders: 0.5 ml; (ID: 18mm; H: 2 mm)
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Mylar or Prolene thin films for sample cups
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High lid for analysis of large samples with maximum dimensions of 10 x 20 x 10 cm3 (H x W x D)
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Omnian Analysis Software for Element or Oxide Quantification without Calibration Standards
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Fluorescent Volume Geometry (FVG) and unmeasured 'Dark Matrix' compound corrections with Omnian