SmartLab X-Ray Diffractometer

Analysis of polycrystalline and epitaxial thin-films and related materials


XRD - Smartlab - Diane Dickie and Sam Jaszewski (2).jpg

Location: Jesser Hall room 108

The SmartLab X-ray diffractometer from Rigaku is configured for the analysis of thin films by X-ray diffraction

 

XRD Technique Summary:

 
  • Non-destructive analysis of any polycrystalline material, particularly thin films
  • Determine the 3-D structure of any crystal phase at the atomic or molecular level
  • Determine texture, stress, epitaxy relationships and other properties that influence the crystal structure
  • Compare your material to hundreds of thousands of known materials in published databases

XRD Applications:

 
  • X-ray Powder Diffractometry (XPRD)
  • Grazing Incidence X-ray Diffractometry (GIXRD)
  • X-ray Reflectometry (XRR)
  • Texture (Pole Figure)
  • Residual Stress
  • Rocking Curves
  • Reciprocal Space Mapping

XRD Features:

 
  • Source: Water-cooled sealed X‐ray tube with Cu anode (1.54 Å wavelength)
  • Highly sensitive detector with in-plane arm
  • Multiple sample stages, including a non-ambient chamber for high-temperature in situ measurements
  • Customizable optics for the incident and diffracted beam
  • Auto-alignment of samples
  • Access to PDF4+ database and CSD database on separate data processing computer
  • Various user manuals in hard-copy and electronic formats

UVA RATES:

 

Rigaku SmartLab XRD Instrument Usage: $28/hr

Rigaku SmartLab XRD Operator Costs:  $55/hr

 

EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTIONS RATES:

 

Rigaku SmartLab XRD Instrument Usage (Operator Costs Included): $110/hr

 

INDUSTRIAL PARTNER RATES:

 

Rigaku SmartLab XRD Instrument Usage (Operator Costs Included): $250/hr

 

.*Rates are for reference only. See R. White for current instrument costs.