X'pertPro X-Ray Diffractometer

Structure Determination for Polycrystalline Substances


CALENDAR

X'pert Pro Multipurpose X-Ray Diffractometer

Xpert.jpg

Location: MSB 108

The X'Pert Pro diffractometer from Malvern-Panalytical performs a variety of X-ray diffraction measurements on any type of polycrystalline material including inorganic, organometallic and organic substances. It can be easily configured by each user with the optimal combination of optics, detector and sample stage for their experiment and is most often used for point-focus experiments and teaching.

 

XRD Technique Summary:

 
  • Non-destructive analysis of any polycrystalline material including powders, pressed pellets, fibers, thin films and bulk materials
  • Determine the 3-D structure of any crystal phase at the atomic or molecular level
  • Determine texture, stress and other properties that influence the crystal structure
  • Compare your material to hundreds of thousands of known materials in published databases
  • Make measurements in manual mode or build a program
 

XRD Features:

 
  • Source: X‐ray tubes with both line and point-focus configurations
    • Cu anode (1.54 Å wavelength)
    • Mo anode (0.71 Å wavelength)
    • Cr anode (2.29 Å wavelength)
  • Prop detector for 0-D mode data collections and X'Celerator detector for 0-D and 1-D mode data collections
  • Three modes available for X'Celerator detector
    • Receiving slit mode - active length 8.89°
    • Open detector mode (0-D) - active length 8.89° (127 channels)
    • Scanning line mode (1-D) -active length 2.122°
  • Four sample stages available
    • Spinner stage
    • Multi-purpose sample stage with manual phi and Z
    • Open Eulerian cradle with auto chi/phi and manual Z
    • Flat sample bracket
  • Incident beam PreFIX modules: Programmable Divergence Slit, Fixed Collimator Point Focus, and Parallel Beam Mirror
  • Diffracted beam PreFIX modules: 0.18° Parallel Plate Collimator (PPC)
  • Incident beam accessories: Programmable Attenuator, set of manual attenuators, Soller slits (0.04 rad), set of incident beam anti-scatter (IBASS) slits, and set of masks
  • Diffracted beam accessories: Programmable anti-scatter slit (PASS), receiving slits, flat diffracted beam monochromator (adjustable), beta filter (Ni), and Soller slits (0.04 rad)
  • Other accessories: Beam knife, gauge for checking sample height, and fluorescent screens for visualizing X-ray beam
  • Steel sample holders for spinner are available in a variety of sizes
    • For powder: 27 mm diameter x 2.4 mm deep, and 16 mm diameter x 2.4 mm deep for front- and/or back-loading
    • For materials of non-standard size and shape: maximum 45 mm diameter x maximum 6.5 mm deep
    • For circular solid samples: 30-32.3 mm diameter x maximum 6 mm deep
  • Zero-background sample holders for small amounts of material
  • Manual powder press for back-loading samples
  • Software includes Data Collector, Data Viewer, and HighScore Plus
  • Access to PDF4+ database and CSD database on separate data processing computer
  • Various user manuals in hard-copy and electronic formats

UVA RATES:

 

Panalytical X'pert XRD Instrument Usage: $25/hr

Panalytical X'pert XRD Operator Costs:  $55/hr

 

EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTIONS RATES:

 

Panalytical X'pert XRD Instrument Usage (Operator Costs Included): $100/hr

 

INDUSTRIAL PARTNER RATES:

 

Panalytical X'pert XRD Instrument Usage (Operator Costs Included): $250/hr

 

.*Rates are for reference only. See R. White for current instrument costs.