Facilities Descriptions for Proposals
Examples of Equipment & Facilities sections from submitted proposals can be found on the SEAS PreAward Website.
General Description of NMCF Facilities
(DRAFT COPY:) The Nanoscale Materials Characterization Facility (NMCF) is a state-of-the-art user facility located within UVa's Materials Science and Engineering (MSE) Department available for use by qualified faculty and students at UVa, as well as by researchers from other institutions. The NMCF houses two scanning electron microscopes (SEMs): an FEI Quanta 650, high-resolution FE-SEM with energy dispersive X-ray spectroscopy (EDS) for elemental analysis and an electron backscatter detector (EBSD) for grain orientation mapping, and an FEI Quanta 200LV environmental SEM with EDS and cathodoluminescence (CL) for spatially resolved band-structure determination. NMCF has two atomic-resolution transmission electron microscopes (TEMs): a scanning FEI Titan with EFTEM and HAADF Detector and a Thermo-Fisher Themis Z 60-300 kV HR-TEM, both incorporating EDS and EELS for compositional analysis and mapping. A Helios dual SEM-focused ion beam (FIB) system can be utilized for TEM sample preparation, patterning, or cross-sectional analysis. NMCF houses three X-ray diffraction (XRD) instruments (Panalytical Empyrean & X'pertPro; Rigaku SmartLab) for information on bulk material composition and phase for any polycrystalline material, an Xradia X-ray computed tomography (XCT) instrument providing detailed 3-D internal structural imaging, and an X-ray fluorescence (XRF) spectrometer for highly-sensitive elemental composition. An integrated Renishaw Raman spectrometer / Bruker atomic force microscope (AFM) system combines molecular identification and surface chemistry with nano-scale surface topography and electrostatics. These bulk-analysis techniques are complimented by an imaging X-ray photoelectron spectrometer (XPS) for quantitative chemistry and composition of the near-surface (~5nm) with floating-column ion gun for depth profiling, a Zygo 7300 white-light profilometer for surface metrology, and a Hirox digital light microscope for 2D/3D imaging and videography. Additionally, NMCF has a complete suite of metallurgical equipment for cutting, mounting, polishing, sputter coating, etching, and plasma cleaning, as well as Rockwell and Vickers hardness testing.
Additional information and figures for proposals are available for select instrumentation:
- Versaprobe III: Scanning X-ray Photoelectron Spectroscopy (i-XPS)