A complete suite of instrumentation for probing and measuring the structure of a material and its chemical properties from macro-scale to atom by atom....
NMCF state-of-the-art instruments routinely provide information to researchers related to materials development, process control, failure analysis, defect location, characterization, and education in a variety of fields including: materials science (metals, ceramics, and polymers), engineering (electrical, mechanical, and chemical), catalysis, chemistry, biology and medicine, geology, construction, and environmental science.
New additions to our laboratory include (1) an ultra-high resolution, aberration-corrected, Themis-Z STEM - unique in the U.S. (2) a Helios dual-beam FIB with EDS, EBSD, STEM, and cryoholder, (3) an Empyrean XRD and (4) a PHI Versaprobe III imaging XPS instrument with < 10 µm resolution.
Current NMCF instrumentation:
- Electron microscopes and focused ion beam including STEM and SEM with EDS, EBSD, EELS, and cathodoluminescence
- X-ray characterization instrumentation including XRD, XPS, XCT, and XRF
- Optical microscopes including Raman Spectrometer with AFM, optical profilometer, and digital microscope.
- Sample preparation and testing instrumentation including ion mills, plasma source, sputter coating, polishing, hardness testing, etc.
NMCF staff are available for sample analysis, instrument training (UVa), and consultation. Our team can help determine optimal characterization method or improve analytical technique.