A complete suite of instrumentation for probing and measuring the structure of a material and its chemical properties from macro-scale to atom by atom....
NMCF state-of-the-art instruments routinely provide information to researchers related to materials development, process control, failure analysis, defect location, characterization, and education in a variety of fields including: materials science (metals, ceramics, and polymers), engineering (electrical, mechanical, and chemical), catalysis, chemistry, biology and medicine, geology, construction, and environmental science.
New additions to our laboratory include (1) an ultra-high resolution, aberration-corrected, Themis-Z STEM - unique in the U.S. (2) a Helios dual-beam FIB with EDS, EBSD, STEM, and cryoholder, (3) a Bruker FTIR with ATR and diffuse reflectance accessories and (4) a ThermoFisher Phenom XLG2 tabletop SEM with EDS with < 10 nm spatial resolution.
Current NMCF instrumentation:
Electron microscopes and focused ion beam including STEM and SEM with EDS, EBSD, EELS, and cathodoluminescence
X-ray characterization instrumentation including XRD, XPS and AR-XPS, XRR, and XRF
Optical spectrometers and microscopes including Raman Spectrometer with AFM, FTIR with ATR and diffuse reflectance accessories, optical profilometer, and digital microscope.
Sample preparation and testing instrumentation including ion milling, plasma cleaning/activation, sputter coating, polishing, hardness testing, etc.
NMCF staff are available for sample analysis, instrument training (UVa), and consultation. Our team can help determine optimal characterization method or improve analytical technique.