NMCF Instruments

A complete suite of instrumentation for probing and measuring the structure of a material and its chemical properties from macro-scale to atom by atom....


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NMCF state-of-the-art instruments routinely provide information to researchers related to materials development, process control, failure analysis, defect location, characterization, and education in a variety of fields including: materials science (metals, ceramics, and polymers), engineering (electrical, mechanical, and chemical), catalysis, chemistry, biology and medicine, geology, construction, and environmental science. 

New additions to our laboratory include (1) an ultra-high resolution, aberration-corrected, Themis-Z  STEM - unique in the U.S. (2) a Helios dual-beam FIB with EDS, EBSD, STEM, and cryoholder, (3) an Empyrean XRD and (4) a PHI Versaprobe III imaging XPS instrument with < 10 µm resolution.

Current NMCF instrumentation:

NMCF staff are available for sample analysis, instrument training (UVa), and consultation. Our team can help determine optimal characterization method or improve analytical technique.

 

Evans Analytical Group Bubble Chart: technique sensitivity as a function of spatial resolution

Evans Analytical Group (EAG) Bubble Chart describing analytical sensitivity as a function of spatial resolution and information depth by technique. This chart can be utilized to determine the most appropriate characterization technique for sample-specific solutions.

Evans Analytical Group Chart : Analytical Technique Information Depth

Evans Analytical Group (EAG) Chart describing the analytical information depth as a function of technique. This chart can be utilized to determine the most appropriate characterization technique for sample-specific solutions.