A complete suite of instrumentation for probing and measuring the structure of a material and its chemical properties from macro-scale to atom by atom....
NMCF state-of-the-art instruments routinely provide information to researchers related to materials development, process control, failure analysis, defect location, characterization, and education in a variety of fields including: materials science (metals, ceramics, and polymers), engineering (electrical, mechanical, and chemical), catalysis, chemistry, biology and medicine, geology, construction, and environmental science.
New additions to our laboratory include (1) an ultra-high resolution, aberration-corrected, Themis-Z STEM - unique in the U.S. (2) a Helios dual-beam FIB with EDS, EBSD, STEM, and cryoholder, (3) an Empyrean XRD and (4) a PHI Versaprobe III imaging XPS instrument with < 10 µm resolution.
Current NMCF instrumentation:
Electron microscopes and focused ion beam including STEM and SEM with EDS, EBSD, EELS, and cathodoluminescence
X-ray characterization instrumentation including XRD, XPS and AR-XPS, XCT, XRR, and XRF
Optical microscopes including Raman Spectrometer with AFM, optical profilometer, and digital microscope.
Sample preparation and testing instrumentation including ion milling, plasma cleaning/activation, sputter coating, polishing, hardness testing, etc.
NMCF staff are available for sample analysis, instrument training (UVa), and consultation. Our team can help determine optimal characterization method or improve analytical technique.