Model of nanoscale material

Nanoscale Materials Characterization Facility

The Nanoscale Materials Characterization Facility (NMCF) staff provide analytical services and solutions to academia and industry by characterizing materials of all types. Analysis of structure, composition, and defects utilizing X-ray diffraction (XRD), surface analysis and chemistry (XPS), metallography, optical imaging and Raman spectroscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are typically combined with elemental analysis.

The NMCF is a state-of-the-art user facility located within UVA's Materials Science and Engineering (MSE) Department. Instrumentation for materials characterization is available for use by qualified faculty and students at UVA, as well as by researchers from other institutions.

Instrumentation

Electron Microscopy for High Resolution Imaging

Macro through Atomic-Scale Imaging, Phase and Compositional Analysis

X-ray Instrumentation for Materials Characterization

Determination of bulk and surface elemental composition, chemistry and phase

Optical Spectroscopy & Microscopy

Surface topography, roughness, and porosity analysis; 2-D/3-D videography and imaging; sample preparation/testing equipment

Ask The Experts!

Our team of instrumentation specialists is here to help.

More About Us

  • Recent Publications

    Recent peer-reviewed publications utilizing NMCF instrumentation

  • NMCF Can Help!

    EDX? XRD? XPS? TEM? EBSD? Need assistance selecting the appropriate materials characterization method? NMCF can help!