Bio

B.S., Materials Engineering, Iowa State University, 2002M.M.S.E., North Carolina State University, 2005Ph.D., Materials Science and Engineering, North Carolina State University, 2006Post-Doc at The Pennsylvania State University, 2006-2008

Our group studies the process-structure-property relations in ferroelectric, dielectric, and ion-conducting oxides. The group primarily focuses on thin films prepared by a wide range of methods, including: pulsed laser ablation, sputtering, atomic layer deposition, and chemical solution deposition. We use the linakges between process, structure, and properties to enable materials integration resulting in novel electronic, thermal, or optical functionality and devices. This includes demonstration of active phonon transport regulation using ferroelectrics, methods to interrogate nanoscale ferroelectric domain structure in active devices, property enhancement via improved material integration, and fast ion conducting thin films for energy storage, among others.

Bio: Jon Ihlefeld is an Associate Professor in the Materials Science and Engineering and Electrical and Computer Engineering Departments at the University of Virginia. He joined UVA in 2017 following a career at Sandia National Laboratories in Albuquerque, NM where he held positions of Senior, Principal, and Distinguished Member of the Technical Staff in the Materials Science and Engineering Center. He is a past Chair of the Electronics Division of The American Ceramic Society, an Associate Editor of the Journal of The American Ceramic Society, a Principal Editor of the Journal of Materials Research, and serves on the Editorial Advisory Board for Applied Physics Letters.

Awards

  • Defense Advanced Research Projects Agency, Young Faculty Award 2020
  • Richard M. Fulrath Award of The American Ceramic Society 2017
  • Sandia National Laboratories Special Appointment to Distinguished Staff Member 2017
  • R&D 100 Award, Ultra-Wide-Bandgap Power Electronics 2017
  • IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society Ferroelectrics Young Investigator Award 2016
  • IEEE Senior Member Elevation 2016
  • Sandia National Laboratories Postdoctoral Professional Development Program Distinguished Mentorship Award 2015
  • Sandia National Laboratories Up & Coming Innovator 2015
  • Sandia National Laboratories Mission Innovator 2015
  • R&D 100 Award, Solution Deposition Planarization 2010
  • U.S. Department of Education GAANN Fellow 2002
  • Iowa State University, Materials Science and Engineering, Most Outstanding Senior Award 2002

Research Interests

  • Ferroelectric Materials and Properties
  • Dielectrics and Integration
  • Ion Conducting Ceramics and Thin Films
  • Complex Oxides
  • Thin Film Processing Science
  • Thermal Transport

Selected Publications

  • Phase Exchange-Driven Wake-Up and Fatigue in Ferroelectric Hafnium Zirconium Oxide Films, ACS Applied Materials and Interfaces, 12(23), 26577-26585 (2020). ABS Shelby S. Fields, Sean W. Smith, Philip J. Ryan, Samantha T. Jaszewski, Ian A. Brummel, Alejandro Salanova, Giovanni Esteves, Steve L. Wolfley, Michael D. Henry, Paul S. Davids, and Jon F. Ihlefeld
  • Voltage Controlled Bistable Thermal Conductivity in Suspended Ferroelectric Thin Film Membranes, ACS Applied Materials and Interfaces, 10(30) 25493–25501 (2018) ABS Brian M. Foley, Margeaux Wallace, John T. Gaskins, Elizabeth A. Paisley, Raegan L. Johnson-Wilke, Jong-Woo Kim, Philip J. Ryan, Susan Trolier-McKinstry, Patrick E. Hopkins, and Jon F. Ihlefeld
  • Pyroelectric response in crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films, Applied Physics Letters, 110, 072901 (2017) ABS S. W. Smith, A. R. Kitahara, M. A. Rodriguez, M. D. Henry, M. T. Brumbach, and J. F. Ihlefeld
  • Oxygen partial pressure dependence of thermoelectric power factor in polycrystalline n-type SrTiO3: Consequences for long term stability in thermoelectric oxides, Applied Physics Letters, 110, 173901 (2017) ABS Peter A. Sharma, Harlan J. Brown-Shaklee, and Jon F. Ihlefeld
  • Domain imaging in ferroelectric thin films via channeling-contrast backscattered electron microscopy, Journal of Materials Science, 52(2), 1071-1081 (2017) ABS Jon F. Ihlefeld, Joseph R. Michael, Bonnie B. McKenzie, David A. Scrymgeour, Jon-Paul Maria, Elizabeth A. Paisley, and Andrew R. Kitahara
  • Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process-Structure-Property Relations, Journal of the American Ceramic Society, 99(8), 2537-2557 (2016) ABS Jon F. Ihlefeld, David T. Harris, Ryan Keech, Jacob L. Jones, Jon-Paul Maria, and Susan Trolier-McKinstry
  • Room-temperature voltage tunable phonon thermal conductivity via reconfigurable interfaces in ferroelectric thin films, Nano Letters, 15(3), 1791-1795 (2015) ABS Jon F. Ihlefeld, Brian M. Foley, David A. Scrymgeour, Joseph R. Michael, Bonnie B. McKenzie, Douglas L. Medlin, Margeaux Wallace, Susan Trolier-McKinstry, and Patrick E. Hopkins
  • Spectroscopic investigations of band offsets of MgO|AlxGa1-xN epitaxial heterostructures with varying AlN content, Applied Physics Letters, 107, 102101 (2015) ABS Elizabeth A. Paisley, Michael Brumbach, Andrew A. Allerman, Stanley Atcitty, Albert G. Baca, Andrew M. Armstrong, Robert J. Kaplar, and Jon F. Ihlefeld
  • Chemically Homogeneous Complex Oxide Thin Films Via Improved Substrate Metallization, Advanced Functional Materials, 22(11) 2295-2302 (2012) ABS Christopher T. Shelton, Paul G. Kotula, Geoff L. Brennecka, Peter G. Lam, Kelsey E. Meyer, Jon-Paul Maria, Brady J. Gibbons, and Jon F. Ihlefeld
  • Fast Lithium‐Ion Conducting Thin‐Film Electrolytes Integrated Directly on Flexible Substrates for High‐Power Solid‐State Batteries, Advanced Materials, 23(47) 5663-5667 (2011) ABS Jon F. Ihlefeld, Paul G. Clem, Barney L. Doyle, Paul G. Kotula, Kyle R. Fenton, and Christopher A. Apblett
  • Optical band gap of BiFeO3 grown by molecular-beam epitaxy, Applied Physics Letters, 92, 142908 (2008) ABS J.F. Ihlefeld, N.J. Podraza, Z.K. Liu, R.C. Rai, X. Xu, T. Heeg, Y.B. Chen, J. Li, R.W. Collins, J.L. Musfeldt, X.Q. Pan, J. Schubert, R. Ramesh, and D.G. Schlom
  • Enhanced dielectric and crystalline properties in ferroelectric barium titanate thin films, Advanced Functional Materials, 17(7) 1199-1203, (2007) ABS J. F. Ihlefeld, W. J. Borland, J-P. Maria

Courses Taught

  • MSE 3101 Materials Science Investigations S' 18, 19, 20
  • MSE 4595/6595 ECE 4501/6501 Dielectrics, Electronic Oxides, and Devices F' 18, 19
  • MSE 7140 / ECE 7501 Physics Of Materials F' 20