B.S. ​Rice University, 1986M.S. ​California Institute of Technology, 1987Ph.D. ​California Institute of Technology, 1992Post-Doc ​Chalmers University of Technology, Gothenburg Sweden, 1992-93

"We research technologies that bridge the worlds of electronics and photonics, allowing new instruments for scientific inquiry and study to be created."

Robert M. Weikle, II, Professor

Robert M. Weikle, II received his B.S. in electrical engineering and physics from Rice University in 1986, and his M.S. and Ph.D. in electrical engineering from the California Institute of Technology in 1987 and 1992, respectively. At Caltech, he developed a variety of new techniques for realizing and modeling arrays of coupled nonlinear active devices for microwave/millimeter-wave power combining. For this work, he shared the 1993 IEEE Microwave Prize. During 1992, Dr. Weikle was a postdoctoral research associate with the Department of Applied Electron Physics at Chalmers Tekniska Hogskola in Goteborg, Sweden where he
worked on millimeter-wave amplifiers based on high electron mobility transistors and low-noise terahertz mixers using superconducting hot electron bolometers.

In January 1993, Dr. Weikle joined the faculty of the University of Virginia where he is currently Professor in the Charles L. Brown Department of Electrical and Computer Engineering. During this time, he has built a laboratory for millimeter and submillimeter-wave device characterization, circuit design, prototyping, and metrology and has pursued research on millimeter-wave and submillimeter-wave electronics, devices, and systems. Among his groups' research efforts are design and fabrication techniques for submillimeter-wave integrated circuits, heterogenous integraton of III-V semiconductor devices with micromachined silicon, investigation of measurement instrumentation and calibration techniques for terahertz device and circuit characterization (including micromachined probes for submillimeter-wave on-wafer measurements), and research on planar antennas and quasi-optical components for millimeter-wave imaging and power-combining.

In 2011, Dr. Weikle co-founded Dominion Microprobes, Inc., with colleagues Scott Barker and Arthur Lichtenberger, to develop on-wafer probe technologies for terahertz measurements. He currently serves at its Chief Technology Officer.


  • IEEE Microwave Prize 1993
  • David A. Harrison III Award, University of Virginia 1999
  • All-University Teaching Award, University of Virginia 2001
  • Faculty Educational Innovation Award, Department of Electrical and Computer Engineering, University of Virginia 2015
  • Edlich-Henderson Innovator of the Year Award, University of Virginia 2016

Research Interests

  • Millimeter-Wave and Terahertz Electronics
  • Wireless and Optical Communication Systems

Selected Publications

  • "A W-band micromachined on-wafer probe with integrated balun for characterization of differential circuits," IEEE Trans. Microwave Theory and Tech., vol. 64, no. 5, pp. 1585-1593, May 2016. C. Zhang, M.F. Bauwens, N. Scott Barker, R. M. Weikle, II, A.W. Lichtenberger
  • "Design and characterization of integrated submillimeter-wave quasi-vertical diodes," IEEE Transactions on Terahertz Sci. and Tech., vol. 5, no. 1, pp. 73-80, January 2015. N. Alijabbari, M.F. Bauwens, and R.M. Weikle, II
  • "160 GHz balanced frequency quadruplers based on quasi-vertical Schottky varactors integrated on micromachined silicon," IEEE Transactions on Terahertz Sci. and Tech., vol. 4, no. 6, pp. 679-685, November 2014. N. Alijabbari, M.F. Bauwens, and R.M.Weikle, II
  • “Characterization of micromachined on-wafer probes for the 600―900 GHz band," IEEE Trans. Terahertz Sci. and Tech., vol. 4, no. 4, pp. 527―529, July 2014. M.F. Bauwens, L. Chen, C. Zhang, A. Arsenovic, A.W. Lichtenberger, N.S. Barker, and R.M. Weikle, II
  • "An experimental technique for calibration uncertainty analysis," IEEE Trans. Microwave Theory Tech., vol. 61, no. 1, pp. 263-269, January 2013. A. Arsenovic, L. Chen, M.F. Bauwens, H. Li, N.S. Barker, and R.M. Weikle, II
  • "Terahertz micromachined on-wafer probes: repeatability and reliability," IEEE Trans. Microwave Theory and Tech., vol. 60, no. 9, pp. 2894-2902, September 2012. L. Chen, C. Zhang, T.J. Reck, A. Arsenovic, M. Bauwens, C. Groppi, A.W. Lichtenberger, R.M. Weikle, II, and N. Scott Barker
  • “Micromachined probes for submillimeter-wave on-wafer measurements part II - RF design and characterization," IEEE Trans. Terahertz Sci. and Tech., vol. 1, no. 2, pp. 349―356, November 2011. T.J. Reck, L. Chen, C. Zhang, A. Arsenovic, C. Groppi, A. Lichtenberger, R.M.Weikle II, and N.S. Barker

Courses Taught

  • ECE 3209 - Electromagnetic Fields
  • ECE 4265 - Microwave Engineering Laboratory
  • ECE 5260 - Microwave Engineering
  • ECE 7209 - Techniques of Advanced Electromagnetics