Ceylan present their work, which is published in ISVLSI'24, during UVA ECE Welcome (Back) Breakfast.
M Ceylan Morgul, Xinfei Guo, and Mircea Stan, "Unveiling Proactive Recovery's Preventative Impact on NAND Flash Wearout", ISVLSI'24.
HPLP Welcomed Incoming Students With One of its Works