X. Guo and Mircea R. Stan publish a new book titled, " Circadian Rhythms for Future Resilient Electronic Systems: Accelerated Active Self-Healing for Integrated Circuits". The book covers topics on methods to address wearout/aging degradation's in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundries provided models and predictive models.