M Ceylan Morgul, Xinfei Guo, and Mircea Stan's paper "Unveiling Proactive Recovery's Preventative Impact on NAND Flash Wearout" has been accepted towards ISVLSI'24. Congrats to the authors on their accomplishments. It is presented on July 1st, 2024.
Ceylan's work is accepted at ISVLSI'24