M Ceylan Morgul, Xinfei Guo, and Mircea Stan's paper "Unveiling Proactive Recovery's Preventative Impact on NAND Flash Wearout" has been accepted towards ISVLSI'24. Congrats to the authors on their accomplishments.
M Ceylan Morgul, Xinfei Guo, and Mircea Stan's paper "Unveiling Proactive Recovery's Preventative Impact on NAND Flash Wearout" has been accepted towards ISVLSI'24. Congrats to the authors on their accomplishments.