LASP-UVa Analytical Instrumentation

The current Laboratory for Astrophysics and Surface Physics is a sophisticated and well established facility developed over the past 30 years. Laboratory instrumentation has been specifically tailored to study the effects of radiation interaction with solid surfaces, be it condensed material at extremely low temperatures, regolith analogs, metals/alloys, or returned/meteoritic samples. Our major resources currently include (1) a modern Peabody Scientific Solar Wind (0.2-25 keV) light-ion linear accelerator with Wein filter coupled to a multi-technique, ultra-high vacuum (UHV) analysis chamber with cryogenic sample stage; (2) an Accelerators Inc. 30–100 keV ion implanter with analyzing magnet for species mass-to-charge (m/q) selection and a similar cryogenic end-chamber; and (3) a unique, customized PHI 560 X-ray photoelectron/ Auger electron spectrometer and secondary-ion mass analyzer with multiple low-energy (0.1–5 keV) species-selective ion sources.

 

30-100 keV Ion Implanter: Chemical Synthesis, Radiolysis, Sputtering, & Magnetospheric Weathering

30-100 keV Ion Implanter: Chemical Synthesis, Radiolysis, Sputtering, & Magnetospheric Weathering


0.2-25 keV Light-Ion Linear Accelerator: Space Weathering, Sputtering, & Surface Spectroscopy

0.2-25 keV Light-Ion Linear Accelerator: Space Weathering, Sputtering, & Surface Spectroscopy

PHI 560 XPS/AES/ISS Spectrometer with Low-Energy Ion Gun(s), in situ FT-IR, and Mass Spectrometer  

PHI 560 XPS/AES/ISS Spectrometer with Low-Energy Ion Gun(s), in situ FT-IR, and Mass Spectrometer

UV-Vis-NIR Spectro-photometer with Hot/Cold Low-Pressure Chamber

UV-Vis-NIR Spectro-photometer with Hot/Cold Low-Pressure Chamber

Cryogenic Ice Chamber with QCM, FT-IR, Mass Spectrometry, Gas Doser and Sample Transfer Arm

Cryogenic Ice Chamber with QCM, FT-IR, Mass Spectrometry, Gas Doser and Sample Transfer Arm

 

NMCF PHI Versaprobe III imaging XPS microscope with 0.01-5 keV ion gun, hot-cold stage, & sample prep chamber

NMCF PHI Versaprobe III imaging XPS microscope with 0.01-5 keV ion gun, hot-cold stage, & sample prep chamber

 

Sample Preparation Tools

Sample Preparation Tools

 

Additional Materials Characterization and Analysis Facilities available in UVa’s NMCF: HR-STEM/TEM/FIB-SEM/SEM/Raman-AFM/XRD/XRF/FT-IR/Optical Microscopy

Additional Materials Characterization and Analysis Facilities available in UVa’s NMCF: HR-STEM/TEM/FIB-SEM/SEM/Raman-AFM/XRD/XRF/FT-IR/Optical Microscopy

NMCF Details: HTTPS://ENGINEERING.VIRGINIA.EDU/RESEARCH/FACILITIES/NANOSCALE-MATERIALS-CHARACTERIZATION-FACILITY