Multiferroics

03 April 2014

Multiferroics:

In straintronics based multiferroic logic, thermal perturbations play a decisive role on the dynamic writing error rate. A low voltage applied to the piezoelectric element causes the nanomagnets (NM) magnetization to switch to its hard axis. Upon releasing the stress, the magnetization of the NM relaxes to the easy axis, with its final orientation determined by the dipolar coupling with the left NM, thus achieving a low power Bennett clocked computation. In presence of stagnation points, applied stress, demag field and dipole-dipole interactions, the error rate and switching delay can be controlled by material design and by engineering the stress profile on the nanomagnets.