Micro-Notes from NMCF

Due to the COVID 19 virus the NMCF will be closing Friday afternoon, March 20, 2020.

This is for the safety of the Staff and Students and to lessen your risk to exposure.

We will announce when we are planning to reopen the facility for use again.

Thanks for your Patience and understanding during these difficult times.

XPS Quantification and Peak Fitting Analysis Course
What: Informal lecture class and discussion concerning different approaches to XPS data analysis led by Prof. Petra Reinke. Shockingly, peak-fitting all data is not always the best route to take! And how to use fitting to extract most from your data.
When: Thursday March 12th from 4-6 pm (There might be pizza....)
Where: Wilsdorf Hall Room 101
If you have a specific question, there is still time to add it to the discussion:

To the Moon!

NMCF Raman/AFM and Hardness Testing instrumentation have relocated.

1) UVa's Raman spectrometer with integrated AFM has moved from the second floor of the Materials Science Building (MSB) to the first floor, MSB 142.
2) All hardness testing instrumentation has relocated to MSB 162.
3) The post-processing computer for XPS analysis has also relocated to MSB 162.

Science as Art: Microscopy Image Competition (2019)
Each year the Materials Science and Engineering Graduate Student Board hosts a competition for the most stunning images in electron or optical microscopy taken on NMCF instrumentation. The images are evaluated not on their scientific merit, but on their artistic aesthetic. This year's winning micrographs are all scanning electron microscopy images taken using the Quanta 650 or 200 LV SEM instruments. Congratulations to all who participated! And the winners are......1st Place: Diversity by Jon Skelton

Reseachers from the Multifunctional Materials Integration (MMI) research initiative and the Multi-Functional Integrated System Technology (MIST) rely on both the state-of-art characteriation equipment as well as the deep technical knowledge of NMCF's team to provide answers about the physical microstructure, chemical make up and mechnical properties of the materials that will use to create the next generation of devices.
VIDEO: Multi-Functional Integrated System Technology (MIST)

The has FEI Quanta LV200 been upgraded has new environmental scanning electron microscopes (ESEM) software. Getting data is now even faster than before.

Samples of standards.

VIDEO: Jim Howe on CBS19 News