Nanoscale Materials Characterization Instrumentation
Our Instruments
NMCF state-of-the-art instruments routinely provide information to researchers related to materials development, process control, failure analysis, defect location, characterization, and education in a variety of fields including: materials science (metals, ceramics, and polymers), engineering (electrical, mechanical, and chemical), catalysis, chemistry, biology and medicine, geology, construction, and environmental science.
New additions to our laboratory include (1) an ultra-high resolution, aberration-corrected, Themis-Z STEM - unique in the U.S. (2) a Helios dual-beam FIB with EDS, EBSD, STEM, and cryoholder, (3) a Bruker FTIR with ATR and diffuse reflectance accessories, (4) a ThermoFisher Phenom XLG2 tabletop SEM with EDS with < 10 nm spatial resolution, (5) a Rigaku Smartlab XRD, and (6) multiple autopolishers for metallography and sample production.
Current NMCF instrumentation:
- Electron microscopes and focused ion beam including STEM and SEM with EDS, EBSD, EELS, and cathodoluminescence
- X-ray characterization instrumentation including XRD, XPS and AR-XPS, XRR, and XRF
- Optical spectrometers and microscopes including Raman Spectrometer with AFM, FTIR with ATR and diffuse reflectance accessories, optical profilometer, and digital microscope.
- Sample preparation and testing instrumentation including ion milling, plasma cleaning/activation, sputter coating, polishing, hardness testing, etc.
NMCF staff are available for sample analysis, instrument training (UVa), and consultation. Our team can help determine optimal characterization method or improve analytical technique.
