Nanoscale Materials Characterization Facility
Instrumentation
Electron Microscopy for High Resolution Imaging
Macro through Atomic-Scale Imaging, Phase and Compositional Analysis
X-ray Instrumentation for Materials Characterization
Determination of bulk and surface elemental composition, chemistry and phase
Optical Spectroscopy & Microscopy
Surface topography, roughness, and porosity analysis; 2-D/3-D videography and imaging; sample preparation/testing equipment
Sample Preparation and Testing Instrumentation
Sample preparation/testing equipment
State-of-the-art materials characterization.....
The Nanoscale Materials Characterization Facility (NMCF) staff provide analytical services and solutions to academia and industry by characterizing materials of all types. Analysis of structure, composition, and defects utilizing X-ray diffraction, X-ray photoelectron spectroscopy, optical imaging, atomic force microscopy, FT-IR & Raman spectroscopies, and electron microscopies (SEM & HR-S/TEM) which may be combined with elemental analysis.
More About Us
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Facility Instrumentation Tour
Process solutions, defect analysis, and materials characterization solutions for academia and industry. Introduction to the Nanoscale Materials Characterization Facility instruments and capabilities.
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Deciding on the right analytical technique
Need assistance selecting the appropriate materials characterization method?
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NMCF Recent Publications
“Investigating the synergistic benefits of Al on Cr(III) in the passive films of FeCoNi-Cr-Al CCAs in sulfuric acid,” Debashish Sur, Nathan C. Smith, Peter F. Connors, William H. Blades, Mitra L. Taheri, Christopher M. Wolverton, Karl Sieradzki, and John R. Scully, Electrochimica Acta, Vol 513, 145523, (2025)
"Magnesium sulfide powder analyzed by XPS," Noah Jäggi & Catherine A. Dukes, Surf. Sci. Spectra 32 (1): 014001 (2025)
"Two doping strategies for modifying radiative transport in ZrO2-YTaO4 thermal barrier coating materials," Jeroen A. Deijkers, Victor K. Champagne, Nuzhat Maisha, Connor Lothrop, David R. Clarke, & Haydn N.G. Wadley, Acta Materialia, Volume 287,120804 (2025)
NMCF Location.....
The NMCF is located within UVA's Materials Science and Engineering (MSE) Department in Wilsdorf & Jesser Halls. Instrumentation for materials characterization is available for use by qualified faculty and students at UVA, as well as by researchers from industry and academic / government institutions.
Statistics
>130 Monthly NMCF Users
5 NMCF Staff Members
330+ Publications
17 Major Analytical Instruments
Questions? Comments?
Arthur W. Lichtenberger
Dr. Lichtenberger is a Research Professor at UVA and the NRAO Director of the UVA Microfabrication Laboratories. He has built an internationally recognized research program in superconducting materials, devices, circuits and packaging for ultra-sensitive single pixel and and array THz detectors.