Acknowledgements

Please acknowledge use of NMCF instrumentation and personnel in publications and presentations.
Example text (adjust as needed):

Electron Backscatter Diffraction (EBSD) images were acquired at the University of Virginia Nanoscale Materials Characterization Facility (NMCF), supported in part by the School of Engineering and Applied Science. We appreciate the assistance of Dr. Helge Heinrich in training the authors to use the Helios UC G4 Dual Beam FIB-SEM.