Themis 60-300 kV Transmission Electron Microscope (TEM)

Atomic-Scale Imaging and Nanoscale Compositional Analysis for Materials
Helge Heinrich works on the Themis

About

Location: Wilsdorf Hall B011 and B013

The Themis system from Thermo Fisher Scientific allows for imaging of materials with atomic resolution in both the Transmission Electron Microscopy (TEM) and the probe-corrected Scanning TEM (STEM) modes. Compositional analyses and mapping are available using Energy Dispersive X-Ray Spectroscopy (EDS) and Electron Energy-Loss Spectroscopy (EELS).

TEM Technique Summary:

  • Atomic resolution imaging of crystal lattices in TEM and STEM modes
  • Imaging of defects, precipitates and interfaces using bright- and dark-field techniques
  • Elemental Composition for Z>2
  • Elemental Sensitivity: < 1 wt.% with spatial resolution in the nm range
  • Electron diffraction for structural analysis of areas with diameters > 150 nm
  • In-situ of imaging of samples during cooling and heating experiments
  • In-situ imaging of liquids and during electrochemical experiments
  • Samples can be powders or materials thinned to less than 1 micron in thickness
  • Maximum sample diameter: 3 mm, maximum height: 0.25 mm

TEM Features:

  • 80-300 kV S-Twin platform
  • STEM and TEM system with Field Emission Gun and Gatan 966 Energy-Loss Spectrometer
  • Monochromator: Energy resolution<200 mV at 300 kV, energy resolution<30 mV at 60 kV
  • Resolution: probe-corrected STEM: 0.07 nm; TEM: 0.19 nm
  • Super X EDS system (4 silicon drift detectors)
  • Low-background Double-Tilt Specimen Holder, alpha tilt angles up to 40°
  • Cold Stage (liquid nitrogen) and Heating Stage (up to 850°C) Double-Tilt Specimen Holders
  • Rotation holder and q-slit for momentum resolved EELS
  • Poseidon liquid cell holder for in-situ electrochemical experiments
  • Ceta camera: 4096x4096 pixels
  • HAADF, BF, DF, and Differential Phase Contrast detectors for STEM

Rates

UVA RATES:

Themis Z 3.1 STEM Instrument Usage: $95/hr

Themis Z 3.1 STEM Operator Costs:  $60/hr

TEM Specialty Holder Use: $10/day

EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTIONS RATES:

Themis Z 3.1 STEM Instrument Usage: $100/hr

Themis Z 3.1 STEM Operator Costs:  $70/hr

TEM Specialty Holder Use: $20/day

INDUSTRIAL PARTNER RATES:

Themis Z 3.1 STEM Instrument Usage: $225/hr

Themis Z 3.1 STEM Operator Costs:  $125/hr

TEM Specialty Holder Use: $60/day

Contact Us

Helge Heinrich

Research Scientist, Materials Science & Engineering Principal Scientist for HR-S/TEM & FIB-SEM

Dr. Helge Heinrich joined the NMCF as the Principal Scientist for High-resolution Transmission Electron Microscopy, with expertise in focused ion beam sample preparation and cross sectional electron microscopy (FIB-SEM) from the University of Central Florida.
Email hhh8n@virginia.edu
Phone (434) 297-6391

Richard White

Laboratory Manager, Materials Science & Engineering NMCF Facility Manager NMCF Principal Scientist for SEM, TEM, Optical, Metallography

Richard White is the NMCF Laboratory Manager and Electron Microscopy & Metallurgy Specialist. He specializes in Scanning Electron Microscopy imaging and compositional analysis; Optical Microscopy; Hardness Measurements; and Metallurgical Techniques for SEM and TEM. 
Email rrw3q@virginia.edu
Phone (434) 982-5657