Optical Microscopy Rates
Usage rates are grouped into broad categories by technique and then by UVa or external use. Internal UVa users can be trained to use the equipment independently or be assisted by an instrument specialist. Industrial partner and external academic / government institutional rates include the support of an instrument specialist.
Rates
UVA RATES:
Renishaw Raman / AFM Instrument Usage: $28/hr (Raman) & $ 20/hr (AFM)
Renishaw Raman / AFM Operator Costs: $60/hr
Hot/Cold Stage Use: $10/session
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:
Renishaw Raman / AFM Instrument Usage (Operator Costs Included): $110/hr (Raman) & $100/hr (AFM)
Hot/Cold Stage Use: $10/session
INDUSTRIAL PARTNER RATES:
Renishaw Raman / AFM Instrument Usage (Operator Costs Included): $200/hr (Raman) & $160/hr (AFM)
Hot/Cold Stage Use: $20/session
UVA RATES:
Zygo Profilometer Instrument Usage: $33/hr
Zygo Profilometer Operator Costs: $60/hr
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:
Zygo Profilometer Instrument Usage: $55/hr
Zygo Profilometer Operator Costs: $70/hr
INDUSTRIAL PARTNER RATES:
Zygo Profilometer Instrument Usage: $60/hr
Zygo Profilometer Operator Costs: $125/hr
UVA RATES:
Hirox Microscope Instrument Usage: $17/hr
Hirox Microscope Operator Costs: $60/hr
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:
Hirox Microscope Instrument Usage: $25/hr
Hirox Microscope Operator Costs: $70/hr
INDUSTRIAL PARTNER RATES:
Hirox Microscope Instrument Usage: $60/hr
Hirox Microscope Operator Costs: $125/hr
UVA RATES:
Bruker Invenio-S FTIR Instrument Usage: $28/hr
Bruker Invenio-S FTIR Operator Costs: $60/hr
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:
Bruker Invenio-S FTIR Instrument Usage (Operator Costs Included): $110/hr
INDUSTRIAL PARTNER RATES:
Bruker Invenio-S FTIR Instrument Usage (Operator Costs Included): $175/hr
Contact Us
Richard White
Richard White is the NMCF Laboratory Manager and Electron Microscopy & Metallurgy Specialist. He specializes in Scanning Electron Microscopy imaging and compositional analysis; Optical Microscopy; Hardness Measurements; and Metallurgical Techniques for SEM and TEM.