Optical Microscopy Rates
Usage rates are grouped into broad categories by technique and then by UVa or external use. Internal UVa users can be trained to use the equipment independently or be assisted by an instrument specialist. Industrial partner and external academic / government institutional rates include the support of an instrument specialist.
Rates
UVA RATES:
Renishaw Raman / AFM Instrument Usage: $30/hr (Raman) & $30/hr (AFM)
Renishaw Raman / AFM Operator Costs: $63/hr
Hot/Cold Stage Use: $10/session
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:
Renishaw Raman / AFM Instrument Usage: $42/hr (Raman) & $42/hr (AFM)
Renishaw Raman / AFM Operator Costs: $82/hr
Hot/Cold Stage Use: $10/session
INDUSTRIAL PARTNER RATES:
Renishaw Raman / AFM Instrument Usage: $60/hr (Raman) & $60/hr (AFM)
Renishaw Raman / AFM Operator Costs: $131/hr
Hot/Cold Stage Use: $20/session
UVA RATES:
Zygo Profilometer Instrument Usage: $35/hr
Zygo Profilometer Operator Costs: $63/hr
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:
Zygo Profilometer Instrument Usage: $63/hr
Zygo Profilometer Operator Costs: $82/hr
INDUSTRIAL PARTNER RATES:
Zygo Profilometer Instrument Usage: $100/hr
Zygo Profilometer Operator Costs: $131/hr
UVA RATES:
Hirox Microscope Instrument Usage: $18/hr
Hirox Microscope Operator Costs: $63/hr
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:
Hirox Microscope Instrument Usage: $30/hr
Hirox Microscope Operator Costs: $82/hr
INDUSTRIAL PARTNER RATES:
Hirox Microscope Instrument Usage: $63/hr
Hirox Microscope Operator Costs: $131/hr
UVA RATES:
Bruker Invenio-S FTIR Instrument Usage: $27/hr
Bruker Invenio-S FTIR Operator Costs: $63/hr
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTION RATES:
Bruker Invenio-S FTIR Instrument Usage: $42/hr
Bruker Invenio-S FTIR Operator Costs: $82/hr
INDUSTRIAL PARTNER RATES:
Bruker Invenio-S FTIR Instrument Usage: $63/hr
Bruker Invenio-S FTIR Operator Costs: $131/hr
Contact Us
Helge Heinrich
Dr. Helge Heinrich joined the NMCF as the Principal Scientist for High-resolution Transmission Electron Microscopy, with expertise in focused ion beam sample preparation and cross sectional electron microscopy (FIB-SEM) from the University of Central Florida.
Arthur W. Lichtenberger
Dr. Lichtenberger is a Research Professor at UVA and the NRAO Director of the UVA Microfabrication Laboratories. He has built an internationally recognized research program in superconducting materials, devices, circuits and packaging for ultra-sensitive single pixel and and array THz detectors.