FEI Titan Transmission Electron Microscope (TEM)

Atomic-Scale Imaging and Nanoscale Compositional Analysis for Materials
Titan TEM with results

About

Location: Jesser Hall room 158

The FEI Titan system allows for imaging of materials with atomic resolution in both the Transmission Electron Microscopy (TEM) and the Scanning TEM (STEM) modes. Compositional analysis is available using Energy Dispersive X-Ray Spectroscopy (EDX).

TEM Technique Summary:

  • Atomic resolution imaging of crystal lattices in TEM and STEM modes
  • Imaging of defects, precipitates and interfaces using bright- and dark-field techniques
  • Elemental Composition for Z>5
  • Elemental Sensitivity: < 1 wt.% with spatial resolution in the 10 nm range
  • Electron diffraction for structural analysis of areas with diameters > 150 nm
  • Cryo- and heating options for samples
  • Samples can be powders or materials thinned to less than 1 micron in thickness
  • Maximum sample diameter: 3 mm, maximum height: 0.25 mm

STEM/TEM Features:

  • 80-300 kV S-Twin platform
  • STEM and TEM system with Field Emission Gun
  • Resolution: STEM: 0.20 nm; TEM: 0.19 nm
  • Oxford EDX X-ray detector for energy dispersive X-ray analysis
  • Low-background Double-Tilt Specimen Holder, alpha tilt angles up to 40°
  • Cold Stage (liquid nitrogen) and Heating Stage (up to 850°C) Double-Tilt Specimen Holders
  • Titan Smart Tilt
  • Gatan Oneview camera: 4096x4096 pixels with 25.1 fps
  • HAADF, Bright Field, and Dark Field STEM detectors
  • Titan Compucentricity
  • Titan Free Lens Control Operating range: 0.5 to 30 kV in 0.1 kV steps

Rates

UVA RATES:

Titan 80-300 STEM Instrument Usage: $72/hr

Titan 80-300 STEM Operator Costs:  $60/hr

TEM Specialty Holder Use: $10/day

EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTIONS RATES:

Titan 80-300 STEM Instrument Usage (Operator Costs Included):  $150/hr

TEM Specialty Holder Use: $20/day

INDUSTRIAL PARTNER RATES:

Titan 80-300 STEM Instrument Usage (Operator Costs Included): $325/hr

TEM Specialty Holder Use: $60/day

Contact Us

Helge Heinrich

Research Scientist, Materials Science & Engineering Principal Scientist for HR-S/TEM & FIB-SEM

Dr. Helge Heinrich joined the NMCF as the Principal Scientist for High-resolution Transmission Electron Microscopy, with expertise in focused ion beam sample preparation and cross sectional electron microscopy (FIB-SEM) from the University of Central Florida.
Email hhh8n@virginia.edu
Phone (434) 297-6391

Richard White

Laboratory Manager, Materials Science & Engineering NMCF Facility Manager NMCF Principal Scientist for SEM, TEM, Optical, Metallography

Richard White is the NMCF Laboratory Manager and Electron Microscopy & Metallurgy Specialist. He specializes in Scanning Electron Microscopy imaging and compositional analysis; Optical Microscopy; Hardness Measurements; and Metallurgical Techniques for SEM and TEM. 
Email rrw3q@virginia.edu
Phone (434) 982-5657