X-ray Fluorescence Spectrometer (XRF)

Bulk Elemental Compositional Analysis for Solids, Powders, and Liquids
X-ray Fluorescence Spectrometer

About

Location: Jesser Hall room 108

XRF spectrometer with a silver (Ag) anode x‐ray tube and 50 micron Be window performs non‐destructive identification and quantification (< 1 ppm) of elements from sodium (Na) to americium (Am) in solids, liquids, loose‐ and pressed‐powders. Silicon drift detector for secondary X-ray detection. Omnian standardless analysis software for peak ID and quantification.

XRF Technique Summary:

  • Non-destructive Analysis of Metals, Glasses, Ceramics, Plastics, Geologic Materials, Organics, Art, Ground Water, Catalysts, Pharmacuticals, etc.
  • Elemental Composition of Solids, Liquids, and Loose or Pressed Powders for 11 ≤ Z ≤ 95
  • Identification of Elemental Impurities with Sensitivity < 1 ppm
  • Quantitative Elemental Analysis of Materials using Material Standards or Omnian Standardless Analysis Software Package
  • Spectral Energy Resolution ≤ 145 eV
  • Elemental Sensitivity:< 1 ppm (by weight)
  • Batch analysis with ten-position sample tray
  • Sample size from ~ 100 mg to ~ 1000 g or up to 18 ml or 10 x 20 x 10 cm3 ( H x W x D)

XRF Features:

  • Source: X‐ray tube with Ag anode and 50 micrometer Be window
  • Software selectable beam filters (Cu 500 μm, Al 50 μm, Al 200 μm, Ti 7 μm, Ag 100 μm, Cu 300 μm)
  • Silicon drift detector (SDD) for X-ray detection with a resolution ≤ 145 eV
  • 50 keV X-ray detection max; 9 W max.
  • 10‐position sample tray with 10 standard sample holders and a set of inserts
  • Sample spinner
  • Helium (He) purge system
  • 2-D Optical Geometry with fixed angles
  • Standard sample cup: 18 ml (OD: 35 mm; ID: 28 mm; H: 30 mm)
  • Small mass holders: 0.5 ml; (ID: 18mm; H: 2 mm)
  • Mylar or Prolene thin films for sample cups
  • High lid for analysis of large samples with maximum dimensions of 10 x 20 x 10 cm3 (H x W x D)
  • Omnian Analysis Software for Element or Oxide Quantification without Calibration Standards
  • Fluorescent Volume Geometry (FVG) and unmeasured 'Dark Matrix' compound corrections with Omnian

More information on using OMNIAN Software for standardless quantification can be found on the Malvern-Panalytical Website.

Rates

UVA RATES:

XRF Instrument Usage: $28/hr

XRF Operator Costs:  $60/hr

EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTIONS RATES:

XRF Instrument Usage: $55/hr

XRF Operator Costs:  $70/hr

XRF Sample Cup: $2/sample

INDUSTRIAL PARTNER RATES:

XRF Instrument Usage: $125/hr

XRF Operator Costs:  $125/hr

XRF Sample Cup: $2/sample

Contact Us

Catherine Dukes

Research Scientist, Materials Science & Engineering Director, Laboratory for Astrophysics and Surface Physics NMCF Principal Scientist XPS/XRF/FTIR

Catherine Dukes directs the Laboratory for Astrophysics and Surface Physics (LASP) and provides expertise in X-ray photoelectron spectroscopy (XPS) for the University of Virginia's Nanoscale Materials Characterization Facility (NMCF). Her NSF and NASA funded research focuses on the interaction of radiation with surfaces.
LASP KEVION Irradiation Facility CV (abbreviated)
Email cdukes@virginia.edu
Phone (434) 996-5299

Helge Heinrich

Research Scientist, Materials Science & Engineering Principal Scientist for HR-S/TEM & FIB-SEM

Dr. Helge Heinrich joined the NMCF as the Principal Scientist for High-resolution Transmission Electron Microscopy, with expertise in focused ion beam sample preparation and cross sectional electron microscopy (FIB-SEM) from the University of Central Florida.
Email hhh8n@virginia.edu
Phone (434) 297-6391