SmartLab X-Ray Diffractometer

Optimized for thin-film techniques and for micro-diffraction
SmartLab X-Ray Diffractometer

About

Location: Jesser 112

The SmartLab X-ray diffractometer from Rigaku was installed in May 2023. It is the optimal diffractometer for GI-XRD, XRR, micro-diffraction and 2-D techniques.

 

XRD Applications:

  • Bragg-Brentano (para-focusing) or parallel beam geometries
  • X-ray Powder Diffractometry (XPRD)
  • Grazing Incidence X-ray Diffractometry (GIXRD)
  • X-ray Reflectometry (XRR)
  • Texture (Pole Figure)
  • Residual Stress
  • Rocking Curves
  • Reciprocal Space Mapping
  • Micro-diffraction
  • PDF analysis

XRD Features:

  • Sources: Water-cooled sealed X‐ray tubes operating at 40 keV and 50 mA
    • Cu anode (1.54 Å wavelength)
    • Mo anode (0.71 Å wavelength)
  • Detector: HyPix-3000HE
    • 0-D (point), 1-D (line) and 2-D (area) modes
    • Can be mounted in vertical or horizontal positions in 2-D mode
    • Variable sample-to-detector distance of 150-300 mm in 2-D mode
    • In-plane diffraction arm give additional scan axis
  • Sample Stages: variety of sample stages for different techniques and sample sizes
    • Horizontal sample stage with Eulerian cradle with powder and bulk sample holders
    • Rx Ry tilt stage
    • 100 mm XY mapping stage
    • Micro sample holder
    • CCD camera for sample positioning, alignment and mapping
  • Customizable optics for the incident and diffracted beam
    • Cross Beam Optics with Parabolic Mirror (CBO)
    • Cross Beam Optics with poly-capillary (CBO-f) for micro-focus applications
    • Cross Beam Optics with Elliptical Mirror (CBO-E) for Mo source
    • Ge (220) 2-bounce incident beam monochromator
    • Variable incident divergence slits from 0.05 to 7 mm
    • Height limiting slits of 2.0, 5.0 and 10.0 mm
    • Soller slits of 0.5, 2.5 and 5° axial divergence
    • Selection slits and receiving slits
    • Nickel K-beta filter
    • Collimators
  • Software: SmartLab Studio II Data Analysis for instrument control, data collection and analysis with server-based licensing allowing software to be run from any UVA-networked computer
    • SmartLab Guidance for near-automation of common experiments
    • XRD Measurement Plugin
    • Data Manager Plugin
    • Powder Basic Analysis Plugin
    • Powder Comprehensive Analysis Plugin
    • Powder Qualitative (Search) Analysis Plugin
    • Powder Rietveld/WPPF Analysis Plugin
    • XRR Plugin
    • HRXRD plugin
    • Texture Plugin
    • Data Visualization Plugin
    • Pair Distribution Function Software
  • Access to Crystallography Open Database (COD) on diffractometer computer
  • Access to PDF4+ database and CSD database on separate data processing computers
  • Various user manuals in hard-copy and electronic formats

Rates

UVA RATES:

Rigaku SmartLab XRD Instrument Usage: $39/hr

Rigaku SmartLab XRD Operator Costs: $60/hr

EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTIONS RATES:

Rigaku SmartLab XRD Instrument Usage (Operator Costs Included): $125/hr

INDUSTRIAL PARTNER RATES:

Rigaku SmartLab XRD Instrument Usage (Operator Costs Included): $250/hr

Contact Us

Diane Dickie

Senior Scientist, Depts. of Chemistry and Materials Science & Engineering Principal Scientist and Crystallographer for XRD

Dr. Diane Dickie joined the Chemistry Department in January 2018 as a Senior Scientist and X-Ray Crystallographer. She is has a joint appointment with the Materials Science Department. Her office is Room 103 in Jesser Hall (Materials Science and Engineering).