SmartLab X-Ray Diffractometer
Optimized for thin-film techniques and for micro-diffraction
About
Location: Jesser 112
The SmartLab X-ray diffractometer from Rigaku was installed in May 2023. It is the optimal diffractometer for GI-XRD, XRR, micro-diffraction and 2-D techniques.
XRD Applications:
- Bragg-Brentano (para-focusing) or parallel beam geometries
- X-ray Powder Diffractometry (XPRD)
- Grazing Incidence X-ray Diffractometry (GIXRD)
- X-ray Reflectometry (XRR)
- Texture (Pole Figure)
- Residual Stress
- Rocking Curves
- Reciprocal Space Mapping
- Micro-diffraction
- PDF analysis
XRD Features:
- Sources: Water-cooled sealed X‐ray tubes operating at 40 keV and 50 mA
- Cu anode (1.54 Å wavelength)
- Mo anode (0.71 Å wavelength)
- Detector: HyPix-3000HE
- 0-D (point), 1-D (line) and 2-D (area) modes
- Can be mounted in vertical or horizontal positions in 2-D mode
- Variable sample-to-detector distance of 150-300 mm in 2-D mode
- In-plane diffraction arm give additional scan axis
- Sample Stages: variety of sample stages for different techniques and sample sizes
- Horizontal sample stage with Eulerian cradle with powder and bulk sample holders
- Rx Ry tilt stage
- 100 mm XY mapping stage
- Micro sample holder
- CCD camera for sample positioning, alignment and mapping
- Customizable optics for the incident and diffracted beam
- Cross Beam Optics with Parabolic Mirror (CBO)
- Cross Beam Optics with poly-capillary (CBO-f) for micro-focus applications
- Cross Beam Optics with Elliptical Mirror (CBO-E) for Mo source
- Ge (220) 2-bounce incident beam monochromator
- Variable incident divergence slits from 0.05 to 7 mm
- Height limiting slits of 2.0, 5.0 and 10.0 mm
- Soller slits of 0.5, 2.5 and 5° axial divergence
- Selection slits and receiving slits
- Nickel K-beta filter
- Collimators
- Software: SmartLab Studio II Data Analysis for instrument control, data collection and analysis with server-based licensing allowing software to be run from any UVA-networked computer
- SmartLab Guidance for near-automation of common experiments
- XRD Measurement Plugin
- Data Manager Plugin
- Powder Basic Analysis Plugin
- Powder Comprehensive Analysis Plugin
- Powder Qualitative (Search) Analysis Plugin
- Powder Rietveld/WPPF Analysis Plugin
- XRR Plugin
- HRXRD plugin
- Texture Plugin
- Data Visualization Plugin
- Pair Distribution Function Software
- Access to Crystallography Open Database (COD) on diffractometer computer
- Access to PDF4+ database and CSD database on separate data processing computers
- Various user manuals in hard-copy and electronic formats
Rates
UVA RATES:
Rigaku SmartLab XRD Instrument Usage: $39/hr
Rigaku SmartLab XRD Operator Costs: $60/hr
EDUCATIONAL, GOVERNMENT & NON-PROFIT INSTITUTIONS RATES:
Rigaku SmartLab XRD Instrument Usage (Operator Costs Included): $125/hr
INDUSTRIAL PARTNER RATES:
Rigaku SmartLab XRD Instrument Usage (Operator Costs Included): $250/hr
Contact Us
Diane Dickie
Senior Scientist, Depts. of Chemistry and Materials Science & Engineering
Principal Scientist and Crystallographer for XRD
Dr. Diane Dickie joined the Chemistry Department in January 2018 as a Senior Scientist and X-Ray Crystallographer. She is has a joint appointment with the Materials Science Department. Her office is Room 103 in Jesser Hall (Materials Science and Engineering).