NMCF Instrument Training
General and instrument specific safety training is required for all users prior to instrument usage. Students and researchers are then instructed by an NMCF instrument specialist for several sessions, cumulating in a "driver's test" that must be passed before utilizing the equipment independently. Successful completion of a "driver's test" with the instrument specialist is required, allowing the user access to the instrument, the instrument calendar, instrument room, and NMCF email list.
Safety and careful instrumentation usage are paramount; NMCF reserves the right to revoke instrument access if safety interlocks are overridden, instruments are damaged, or scheduling is abused.
**A minimum of 24-hours is required for instrument session cancellations, with additional good-faith effort to fill the slot (e.g. email to users). Financial penalties may be incurred if these rules are not observed.**
Safety Training
All users need to complete the required online EHS Chemical Safety and Waste Module for Researcher Personnel and Students prior to any instrument training. This training must be retaken on a yearly basis. The online EHS training module can be found HERE.
Additional supplementary safety modules for X-ray emitting equipment will be required.
Training Videos
Instrument TRAINING MODULES created for a large number of NMCF instruments/analysis techniques are available on video. Access to training videos requires a Netbadge Login; please use a standard internet browser such as Internet Explorer, Firefox, or Chrome. If you are using an Apple product (Mac, Iphone, Ipad, etc.) note that Quicktime player does not provide sound, and another video player is required.
Sample Preparation
Training modules for sample preparation can be found HERE.
Training and operation information may also be found on individual equipment pages: MAGER CUTOFF SAW, HITACHI IM4000 ION MILL, GATAN PECS, TECHNICS SPUTTER COATER, MULTIPREP POLISHER, GATAN PIPS, HENNIKER PLASMA CLEANER, or the TINIUS OLSEN HARDNESS TESTER.
Instrument Specific Training Information
Instrument | Contact | Training Time & Information |
|---|---|---|
Themis STEM/TEM(WH B013, B011) | Helge Heinrich | 3 sessions (3 hour/session) + previous training on Titan TEM + Driver's Test (3 hours) add'l training for EELS (3 hours) |
Titan STEM/TEM(Jesser 158) | Helge Heinrich | 3 sessions (3 hours); add'l training required for STEM |
Quanta 650 FE-SEM(WH B003) | Joe Thompson | >80% SEM Test + 4 Sessions (2 hours) + Driver's Test (1 hour); |
Phenom SEM(Jesser 139) | Cathy Dukes | >80% Test + 1 Session (2 hours) + Driver's Test (1 hour) |
Helios FIB/SEM(WH B001) | Helge Heinrich | 2 sessions ( 2 hours + previous training on Quanta 650 FE-SEM) OR 3 sessions (2 hours w/ no previous training) + Driver's Test (2 hours) |
Empyrean XRD(Jesser 108) | Diane Dickie | 1 session (2 hour incl. Driver's Test)* |
X'Pert Pro XRD(Jesser 108) | Diane Dickie | 1 session (2 hour incl. Driver's Test)* |
SmartLab XRD(Jesser 108) | Diane Dickie | 1 session (2 hour incl. Driver's Test)* |
Bruker FTIR(Jesser 162) | Cathy Dukes | 1 session (2 hour incl. Driver's Test) |
Epsilon3x XRF(Jesser 108) | Cathy Dukes | 1 session (1.5 hour) + driver's test (1 hour)** |
Versaprobe XPS(Jesser 148) | Cathy Dukes | 2 session (3 hours each) + driver's test (3 hours); |
Renishaw Raman(Jesser 262) | Joe Thompson | 1 session (2 hours) + 1 driver's test (1 hour) |
Bruker AFM(Jesser 262) | Joe Thompson | 1 session (3 hour) + 1 driver's test (1 hour) |
Zygo Profilometer(WH B001) | Joe Thompson | 1 session (2 hours) + 1 driver's test (1 hour) |
Hirox Microscope(Jesser 139) | Joe Thompson | 1 session (2 hours) + 1 driver's test (1 hour) |
MultiPrep Polisher(Jesser 131) | Helge Heinrich | 1 session (TBD) + 1 driver's test (TBD) |
* Supplementary XRD X-ray Safety Training is required
** Supplementary XRF X-ray Safety Training and Gas Cylinder Training is required
*** Supplementary XPS X-ray Safety Training and Gas Cylinder Training is required
Questions? Comments?
Helge Heinrich
Dr. Helge Heinrich joined the NMCF as the Principal Scientist for High-resolution Transmission Electron Microscopy, with expertise in focused ion beam sample preparation and cross sectional electron microscopy (FIB-SEM) from the University of Central Florida.
Diane Dickie
Dr. Diane Dickie joined the Chemistry Department in January 2018 as a Senior Scientist and X-Ray Crystallographer. She is has a joint appointment with the Materials Science Department. Her office is Room 103 in Jesser Hall (Materials Science and Engineering).
Catherine Dukes
Catherine Dukes directs the Laboratory for Astrophysics and Surface Physics (LASP) and provides expertise in X-ray photoelectron spectroscopy (XPS) for the University of Virginia's Nanoscale Materials Characterization Facility (NMCF). Her NSF and NASA funded research focuses on the interaction of radiation with surfaces.
Joe Thompson
Joe Thompson joined the NMCF as a Laboratory Specialist, also providing analysis for the Virginia Department of Transportation (VDOT). He specializes in Raman Spectroscopy, Atomic Force Microscopy, and Optical and Electron Microscopies.