Model of nanoscale material

Nanoscale Materials Characterization Facility

State-of-the-art materials characterization.....

The Nanoscale Materials Characterization Facility (NMCF) staff provide analytical services and solutions to academia and industry by characterizing materials of all types. Analysis of structure, composition, and defects utilizing X-ray diffraction (XRD), surface analysis and chemistry (XPS), metallography, optical imaging, atomic force microscopy (AFM), Raman spectroscopy, and scanning electron microscopy (SEM) and transmission electron microscopy (HR-S/TEM) which are typically combined with elemental analysis.


Electron Microscopy for High Resolution Imaging

Macro through Atomic-Scale Imaging, Phase and Compositional Analysis

X-ray Instrumentation for Materials Characterization

Determination of bulk and surface elemental composition, chemistry and phase

Optical Spectroscopy & Microscopy

Surface topography, roughness, and porosity analysis; 2-D/3-D videography and imaging; sample preparation/testing equipment

More About Us

  • Helge with Themis

    Recent Publications

    Recent peer-reviewed publications utilizing NMCF instrumentation

  • SEM Heightmap

    Deciding on the right analytical technique

    Need assistance selecting the appropriate materials characterization method? 

  • NMCF Team

    Meet the Experts

    The NMCF team is available to analyze, assist, and train. 

NMCF Location.....

The NMCF is located within UVA's Materials Science and Engineering (MSE) Department in Wilsdorf & Jesser Halls. Instrumentation for materials characterization is available for use by qualified faculty and students at UVA, as well as by researchers from industry and academic / government institutions.


>130 Monthly NMCF Users

5 NMCF Staff Members

300+ Publications

17 Major Analytical Instruments