Richard White describing a spectrum acquired on the Helios Focused Ion Beam-Scanning Electron Microscope.

Nanoscale Materials Characterization Facility

Advanced Analytical Services for Academia, Government, and Industry

Instrumentation

Electron Microscopy for High Resolution Imaging

Macro through Atomic-Scale Imaging, Phase and Compositional Analysis

Helios FIB
Quanta 650
Phenom
Talos F200X
Themis-Z

X-ray Instrumentation for Materials Characterization

Determination of bulk and surface elemental composition, chemistry and phase

HiPP Lab XPS System
Versaprobe XPS
D2 Phaser XRD
Smartlab XRD
Empyrean XRD
X'PertPro XRD
Epsilon3X XRF

Light Spectroscopy & Microscopy

Surface topography, roughness, and porosity analysis; 2-D/3-D videography and imaging; sample preparation/testing equipment

Renishaw Raman Spectrometer/Bruker AFM
Bruker FTIR Spectrometer
Hirox Digital Microscope
Zygo Profilometer

Sample Preparation and Testing Instrumentation

Sample preparation/testing equipment

Micro-Vickers/Knoop Hardness Tester
Plasma Cleaner
Ion Mill
Precision Ion Polishing System
Precision Etching and Coating
Precision Cut-off Saw
Additional Instrumentation

State-of-the-art materials characterization.....

The Nanoscale Materials Characterization Facility (NMCF) staff provide analytical services and solutions to academia and industry by characterizing materials of all types. Analysis of structure, composition, and defects utilizing X-ray diffraction, X-ray photoelectron spectroscopy, optical imaging, atomic force microscopy, FT-IR & Raman spectroscopies, and electron microscopies (SEM & HR-S/TEM) which may be combined with elemental analysis.

More About Us

  • Students with Themis TEM

    Facility Instrumentation Tour

    Process solutions, defect analysis, and materials characterization solutions for academia and industry. Introduction to the Nanoscale Materials Characterization Facility instruments and capabilities.

    Let the tour begin.....
  • SEM Heightmap

    Deciding on the right analytical technique

    Need assistance selecting the appropriate materials characterization method? 

    Learn More
  • NMCF Team

    Meet the Experts

    The NMCF team is available to analyze, assist, and train. 

    Contact NMCF Staff

NMCF Recent Publications

“Robust Antiferroelectric Response in the Pbca Phase of Hafnium Zirconium Oxide via Aluminum Substitution,” Y. K. Choi, M. Kang, T. Alem, N. K. Lam, A. L. Watson, K. Burns, S. J. McDonnell, L. Zhou and J. F. Ihlefeld, Journal of the American Ceramic Society 109 (9) (2026). https://doi.org/10.1111/jace.71191 - Bruker FTIR, SmartLab XRD, & Empyrean XRD

 

“Enhanced Ferroelectric Phase Formation via Local Structure Modification in the Pre‐Crystalline State of Hafnium Zirconium Oxide Thin Films,” N. K. Lam, G. R. Bejger, W. A. Wani, K. M. Holsgrove, A. N. Titus, N. Sharma, S. Wang, K. Orson, M. K. Lenox, L. Shvilberg, Y. K. Choi, I. A. Brummel, B. L. Aronson, P. Reinke, Q. Ramasse, A. Kumar, B. J. Rodriguez, C. M. Rost and J. F. Ihlefeld, Advanced Functional Materials (2026). https://doi.org/10.1002/adfm.78109 - Bruker FTIR & SmartLab XRD

 

“Correlating biaxial stress to metastable phases in Hf0.5Zr0.5O2 on substrates with different coefficients of thermal expansion,” N. T. Qureshi, M. Ferasat, L. Johnson, B. L. Aronson, Y. K. Choi, N. K. Lam, M. K. Lenox, J. A. Hachtel, N. Shukla, T. E. Beechem, K. Burns and J. F. Ihlefeld, Applied Physics Letters 129 (14), 142901 (2026). https://doi.org/10.1063/5.0354327 - Bruker FTIR, SmartLab XRD, Themis HR-S/TEM & Helios FIB

 

"Laser removal of silicon solar cell backsheet while preserving tempered glass and silicon wafer." Khetri, M., Kanaujia, P. K., & Gupta, M. C. (2026).  Solar Energy Materials and Solar Cells, 304, 114404. https://www.sciencedirect.com/science/article/abs/pii/S092702482600245X - FEI Quanta 650 SEM/EDS & Renishaw Raman

 

"Superhydrophilic and superhydrophobic surfaces with reversible wettability using laser processing." Chakraborty, A., Khetri, M., Surampudi, A., & Gupta, M. C. (2026).  ACS Omega, 11(19), 27970–27984. https://pubs.acs.org/acsodf/article/11/19/27970/5072114/Superhydrophilic-and-Superhydrophobic-Surfaces - FEI Quanta 650 SEM/EDS & Renishaw Raman

More articles.....

NMCF Location.....

The NMCF is located within UVA's Materials Science and Engineering (MSE) Department in Wilsdorf & Jesser Halls. Instrumentation for materials characterization is available for use by qualified faculty and students at UVA, as well as by researchers from industry and academic / government institutions.

Information for Visitors NMCF Services for Industrial Clients

Statistics

>275 Current NMCF Users

4 NMCF Staff Members

400+ Publications

18 Major Analytical Instruments

Questions? Comments?

Arthur W. Lichtenberger

Research Professor, Electrical and Computer Engineering

Dr. Lichtenberger is a Research Professor at UVA and the NRAO Director of the UVA Microfabrication Laboratories. He has built an internationally recognized research program in superconducting materials, devices, circuits and packaging for ultra-sensitive single pixel and and array THz detectors. 
Email [email protected]