Electron Microscopy for High Resolution Imaging
Macro through Atomic-Scale Imaging, Phase and Compositional Analysis
The Nanoscale Materials Characterization Facility (NMCF) staff provide analytical services and solutions to academia and industry by characterizing materials of all types. Analysis of structure, composition, and defects utilizing X-ray diffraction (XRD), surface analysis and chemistry (XPS), metallography, optical imaging and Raman spectroscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are typically combined with elemental analysis.
The NMCF is a state-of-the-art user facility located within UVA's Materials Science and Engineering (MSE) Department. Instrumentation for materials characterization is available for use by qualified faculty and students at UVA, as well as by researchers from other institutions.
Macro through Atomic-Scale Imaging, Phase and Compositional Analysis
Surface topography, roughness, and porosity analysis; 2-D/3-D videography and imaging; sample preparation/testing equipment
Determination of bulk and surface elemental composition, chemistry and phase
Sample preparation/testing equipment
Process solutions, defect analysis, and materials characterization for academia and industry.....