Jump to Footer

State-of-the-Art Materials Characterization

The Nanoscale Materials Characterization Facility (NMCF) staff provide analytical services and solutions to academia and industry by characterizing materials of all types. Analysis of structure, composition, and defects utilizing X-ray diffraction (XRD), surface analysis and chemistry (XPS), metallography, optical imaging and Raman spectroscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are typically combined with elemental analysis.

The NMCF is a state-of-the-art user facility located within UVA's Materials Science and Engineering (MSE) Department. Instrumentation for materials characterization is available for use by qualified faculty and students at UVA, as well as by researchers from other institutions.

Instrumentation

Our Faculty

Selected Publications

  • The evolution of composition and morphology during the initial growth of electrodeposited Ni-Fe films: Comparison between the potentiostatic mode and the pulse-reverse potential mode Qiyuan Lin & Giovanni Zangari, Electrochimica Acta 409, 139978 (2022)
  • Space weathering effects in troilite by simulated solar-wind hydrogen and helium ion irradiation Christoph, J. M., Minesinger, G. M., Bu, C., Dukes, C. A., & Elkins-Tanton, L. T., Journal of Geophysical Research: Planets, 127, E2021JE006916 (2022)
  • Selective Morphological and Polymorphic Control of CL-20 Thin Films Using Meniscus-Guided Coating Natalie Smith, Stephanie Guthrie, Zbigniew Dreger, and Gaurav Giri, Crystal Growth & Design 22 (2), 1164-1171 (2022)

More About Us

NMCF Instrumentation Tour

Process solutions, defect analysis, and materials characterization for academia and industry.....

  • > 130

    Monthly NMCF Users

  • $ 8 M

    New Equipment Funding

  • 200 +

    Peer-Reviewed Publications

  • 18

    External Client Projects/year